- T -
Tapping
Mode AFM
Transverse
Dynamic Force Microscopy Transverse dynamic force microscopy (TDFM)
is a Dynamic Probe Microscopy
in which the detected force is perpendicular to the
probe, hence "transverse". The first use of this technique
has been the Shear Force Microscopy.
In TDFM, the cantilever is oriented perpendicularly
to the sample and oscillates parallel to its surface.
The interaction between the tip and the sample can
be measured at different separations by observing
the change in amplitude and the relative phase of
the cantilever oscillation. The shear force is often
used in TDFM to obtain topographic images of
the surface. The oscillation amplitude of the probe
decreases monotonically when approaching the surface;
by using the amplitude signal in a feedback loop it
is therefore possible to scan the surface at constant
height. If the system is monitoring amplitude and
phase at the same time, it is also possible to record
phase information while keeping the amplitude constant.
Langmuir 17, 349 (2001). Appl.
Phys. Lett. 78, 300 (2001).
TM
AFM
Topografiner
variable-temperature
SLAM Rev.
Sci. Inctr. 69, 2085 (1998).
tunneling
current and surface-potential simultaneous measuring
system TSM
is the system for tunneling current and surface potential
simultaneous measuring. The distance (d) between a
sample and a probe tip is changed sinusoidally with
high precision. The tunneling current flows periodically
in accordance with the vibration of the tip when d
becomes as small as a few nm. The surface potential
is measured using the principle of the Kelvin method
in which the displacement current due to the presence
of surface potential and the change in capacitance
difference between the tip and the sample is detected.
Simultaneous measurement of the tunneling current
and the displacement current has been attained by
utilizing their phase difference in tip vibration.
Jpn. J. Appl. Phys. 37, 4557 (1998); Phys.
Rev. B 62, 1971 (2000).
Thermal
Scanning Microscope, see Scanning
Thermal Microscope, SThM ThSM
is based upon a noncontacting near-field thermal probe.
Profiling is achieved by scanning the heated sensor above
but close to the surface of a solid. The conduction of heat
between tip and sample via the air provides a means for
maintaining the sample spacing constant during the lateral
scan.
Appl. Phys. Lett. 49, 1587 1986.
TIR
tuning
fork
AFM
with tuning-fork-based height feedback. The attached
to a one prong probe tip oscillates normally to a
sample surface, as in light-lever based noncontact
AFM. The advantages of tuning-fork-based are
follows: the tuning fork is a chip, small hight detector,no
optical alignement is needed, simple and compact instrument
can be designed.
Appl. Phys. Lett. 75, 1640 (1999).
twin-probe
two-pass
mode
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