- D -
DC-EFM
Dynamic Contact Mode
Electrostatic Force Microscopy By operating EFM in a contact mode with an
ac modulation bias, one can to improve the spatial resolution and also to
achieve a complete separation of the topographic effect from other electrostatic
force effect overcoming the mixing problem of a topographic effect with other
electrostatic effects frequently encountered in the conventional noncontact EFM
measurement. Rev. Sci. Instr. 70, 1735 (1999).
dc Electrostatic Force Microscopy
In the dc-EFM, the AFM is operated in noncontact mode with the
cantilever oscillated near its resonant frequency at a small fixed height above
the sample. The changing electrostatic force with z gives a shift in the
resonant frequency and the phase Df of the cantilever oscillation. The measured
signal is thus proportional to the square of the dc voltage difference between
the tip and the sample. In the second approach, called ac- EFM, the cantilever
is made to oscillate by an ac potential Phys. Rev. Lett. 84, 6082 (2000).
DFM
DFS
Dynamic Force Spectroscopy DFS is
a method of tip-sample interaction potentials determination. The method is based
on the measurement of the resonance frequency as a function of the resonance
amplitude of the oscillated cantilever. Phys. Rev. Lett. 83, 4780
(1999).
DM-mode
DPL
Dynamic Powing Lithography
(Nanolithography) By dynamic plowing lithography the surface is modified
by indenting it with a vibrating tip in the AFM tapping mode. This method
provides a lithography technique that is nearly free from problems due to
cantilever torsion and permits us to image the modified surface without any
further modification. Rev. Sci. Instr. 72, 136 (2001)
DPM
Dynamic Probe
Microscopy SPM with laterally or normally to sample surface vibrating
probe. Appl. Phys. Lett. 76, 1203 (2000).
Dynamic Pecking
Mode In DPM sharp, conical, metallic tips oriented perpendicular to the
axis of a rod vibrating in bending (pecking) mode are used as force sensors in
scanned force probes and as optical scatterers in apertureless near-field
optical microscopes. Appl. Phys. Lett. 79, 2657 (2001).
D-STM
DTS
Dual-Amplitude Mode
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