- C -
C-AFM
Conducting
AFM
Contact
mode of AFM operation with conductive tip. The tip-surface
current is measured during scanning.
C
AFM/STM
CAM
constant-amplitude
mode of non-contact AFM. In
constant-amplitude mode the tip is oscillating with
a constant amplitude A of typically 1–10 nm at the eigenfrequency
f of the cantilever, which may shift by Df due to forces
between tip and sample. The oscillation amplitude is kept
constant by a regulation circuit that excites a piezoactuator
with a sinusoidal voltage of the oscillation frequency f
and an amplitude Vexc . The actuator
shakes the fixed end of the cantilever. When the cantilever
oscillation is damped due to the tip-sample interaction,
Vexc will increase to maintain the
oscillation amplitude constant. By recording Df and Vexc
simultaneously, forces and dissipation can be measured.
Phys. Rev. B 62, 13674 (2000); Phys. Rev. B 61, 11151
(2000).
cantilever
vibration mode
An
atomic force microscope (AFM)
combined with ultrasonic frequency vibration of a cantilever
excited at its support. This method enables both topography
and elasticity imaging of stiff samples such as metals and
ceramics, without a need for bonding a transducer to the
sample.
Jpn. J. Appl. Phys. 35(1996) 3787.
CL
calorimetric
analysis with scanning microscopy Rev.
Sci. Instrum. 67, 4268 (1996).
CCCM
SCM
CCM
Calibration
Curve Method or Conversion
Curve Method The
calibration or conversion curve method (CCM) refers to using
a database of calculations of the capacitance done for a
matrix set of model parameters, such as oxide thickness,
uniform dopant density, etc., as one method for interpreting
Scanning
Capacitance Microscope (SCM)
measurements. The method was originally intended to help
analyze SCM data for slowly varying dopant profiles, where
the condition of quasi charge neutrality could be suitably
maintained during SCM measurement.
J. Vac. Sci. Techn. B 18, 414 (2000).
CDI-mode
CEM
CITS
CILO
CODYMode
Combined
Dynamic x Mode In
CODYMode SFM at least two oscillations
with sufficiently different frequencies and amplitudes are
superimposed and interact with the sample surface. This
enables the concurrent measurement of the topography, adhesive
and frictional forces beside further mechanical surface
properties of the sample.
Rev. Sci. Instrum. 72, 150 (2001).
constant-current
mode for STM
In
constant-current mode the feedback keeps the tip-surface
current constant, and one deteckts the variations of the
local height of the tip accordingly to the sample surface.
In this mode one can measure irregular surfaces with high
precision.
constant-force
mode for AFM
In
constant-force mode the feedback keeps the force
betveen the cantilever and sample surface (cantilever bending)
constant.
constant-height
mode for SPM
Constant-height
mode is faster than constant-current
or constant-force
modes since the feedback mechanism is turned off (or is
used with very low gain parameters).
CPD
CSPM
Conductive SPM, see also
Spreading Resistance Profiling (SRP),
Spreading Resistance Microscopy (SRM) Simultaneous topography and current images obtaining in
the contact mode by conductive AFM, with bias applied between
the probe and the sample; hence the current reflects the
nanostructural local conductivity of the sample.
Jap. J. Appl. Phys. 39, 3728 (2000).
CVT
constant-vibration
mode Applied
Physics A 66, # 7, S295 (1998).
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