- F -
FMM
FM
technique
force modulation technique
see Force
Modulation Microscopy
Frequency-Shift
Mode AFM In
this operating mode the tip oscillates with its new eigenfrequency
f' and moves in and out of the interaction region during
each oscillation cycle. The new eigenfrequency is different
by Df from the original eigenfrequency f due to the
tip-surface interaction. An AFM image can be obtained
by fixing Df to a certain constant.
Phys. Rev B 59, 13267 (1999).
FV-mode
A
simple force curve records the force felt by the tip as
it approaches and retracts from a point on the sample surface.
A force volume contains an array of force curves over the
entire sample area and is generated by ramping the z-piezo
as the tip scans across the area as shown in the figure
above. Each force curve is measured at a unique x-y position
in the area, and force curves from an array of x-y points
are combined into a three-dimensional array, or "volume,"
of force data. The value at a point (x,y,z) in the volume
is the deflection (force) of the cantilever at that position
in space. Volumes can be produced from any available imaging
mode such as Tapping
Mode or Phase
Imaging.
http://www.di.com/AppNotes/ForceVol/FVMain.html
fuzzy controlled feedback
Appl
Phys A 66 7, S49 (1998).
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