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Resonance contact scanning force microscope
The resonance contact scanning force microscope includes a reflective cantilever arm which is oscillated at a high harmonic of the resonance frequency of the cantilever arm, while the probe tip is maintained in substantially constant contact with the surface of the specimen. The motion of the free end of the cantilever arm is measured, to generate a deflection signal indicative of the amount of actual deflection of the probe tip. The method and apparatus permit high speed scans and real time imaging of the surface of a specimen with a substantial reduction in noise normally arising due to tip-surface interaction and acoustic noise.
US Pat. 5481908

RTM

Physical Review B 54, 8908 (1996).

RNCM

Repulsive Regime in TM AFM
In the repulsive regime of Tapping-Mode operated AFM, a net repulsive force dominates the amplitude reduction.
Physical Review B 60, 4961

RTFM

Resonant Tapping-Force Microscopy
See Tapping-Mode AFM
Phys. Rev. B 54, 8908 (1996).