Founding
Fathers of Scanning Probe (Proximity) Microscopy
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Russel
Young
(left)
and his co-workers Fredric Scire and John
Ward with the Topografiner,
precursor of SPM.
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Preliminary
remarks.
Main
attention in this Glossary is focused on
SPM
terms related to microscopy
techniques where the probe is brought to nearest proximity
to sample surface, so-called Scanning
Proximity Microscopy (SXM)
techniques.
We do not include in this Glossary terms related to
microscopies with usage particle, ray, beam probes
like the Scanning Electron Microscopy, Ion Microscopy
and so on. |
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