- B -

BEEM

Ballistic Electron Emission Microscopy
BEEM employs STM for investigation subsurface interface in Shottky-barrier systems, semicondfuctor heterojunctions, and other interfaces. Electron tunneling from the tip to the base electrode injects ballistic electrons into the base. The spectrum of base-collector current provides a direct probe of interface electronic structure.
Phys. Rev. B 60, 1406 (1988).

BEES

Ballistic Electron Emission Spectroscopy see Ballistic Electron Emission Microscopy

broadband mode

In this mode of operation the error signal E representing bending of the cantilever not corrected by the feedback is scaled and added to the Z signal to provide a mathematically correct image (I=E+Z).
QUESANT Technical Note No. T-2 (Oct. 1998)