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3d-AFM

    study of force vs. distance curves for every point aliong a scan

ac-EFM

    ac Electrostatic Force Microscope
    In ac-EFM the cantilever is made to oscillate by an ac potential that is applied to the sample at the resonant frequency of the cantilever. This produces an ac force on the cantilever proportional to the local ac potential Vs(w) beneath the tip. The resulting oscillation amplitude is recorded using an external lock-in amplifier; the signal is proportional to Vs(w) .
    Phys. Rev. Lett. 84, 6082 (2000).

Acoustic microscope

    Atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife-edge detector.
    Appl. Phys. Lett. 64, 1493 (1994)

AFM

    Atomic Force Microscope
    AFM is type of Scanning Probe Microscope (or Scanning Proximity Microscope) with a microscopic force sensor as a probe. By scanning the AFM force sensor (flexible cantilever with the tip on the end) over a sample surface (or scanning a sample under the cantilever) and recording the deflection of the cantilever, one can measure the local height, chemical and mechanical properties of a sample.
    Phys.Rev.Lett.56, 930 (1986).

AGC

A-HFM

    Amplitude HFM (Heterodyne Force Microscopy), see HFM

AMFM

    Attractive-mode force microscope.
    Mode of operation of a quartz tuning-fork-based dynamic mode atomic force microscope for the imaging of biological samples under ambient conditions. AMFMuses a stiff cantilever that maintains stable oscillations at low amplitudes even in the presence of capillary and other long range forces that can overwhelm more flexible cantilevers.
    Rev. Sci. Instr. 72, 4261 (2001).

ARTM AFM

ASD

    Amplitude Slope Detectionn
    Measuring a force derivative by deriving a shift in the cantilever resonance frequency from a change in the cantilever vibration amplitude driven at constant frequency.
    J. Appl. Phys. 61, (1987) 4723.

aNFOM

    apertureless NFOM
    This technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. The demonstrated resolution lies in the 3 nm range—comparable to what can be achieved with typical attractive mode atomic force microscopes.
    Appl. Phys. Lett. 65, 1623 (1994).