|
 об Обществе
члены Общества
сотрудничество
есть идеи?
музей СЗМ
компании
конференции
библиотека
|
|
Scanning
Probe Microscopy Terminology
Your
remarks and addings you can leave
here
|
|
Founding
Fathers of Scanning Probe (Proximity) Microscopy
|
|
|
|
| Russel
Young
(left)
and his co-workers Fredric Scire and John
Ward with the Topografiner,
precursor of SPM.
|
Heinrich
Rohrer,
left, and Gerd K.
Binnig
with their STM. |
Preliminary
remarks.
Main
attention in this Glossary is focused on
SPM
terms related to microscopy
techniques where the probe is brought to nearest proximity
to sample surface, so-called Scanning
Proximity Microscopy (SXM)
techniques.
We do not include in this Glossary terms related to
microscopies with usage particle, ray, beam probes
like the Scanning Electron Microscopy, Ion Microscopy
and so on. |
|
По
результатам работы Конференции SPM-2004 дипломами
фирмы NT-MDT награждены
Гущина Ю.Ю., Зайцев Б.Н. и Грибков
Б.А.
В библиотеке Общества выставлены Труды Конференции.
SPM & N news -
07.06.04. Milikelvin scanned probe for measurements of
nanostructures. A scanning force microscope that operates
below 100 mK and in magnetic fields up to 6 T is demonstrated. The microscope is
based upon a quartz tuning fork and has a conducting tip for electrical probing
of nanostructures of interest. Data locating a single electron transistor within
an array and Coulomb blockade measurements are showed.
Rev. Sci. Instrum. 75, 2029 (2004).
|
