|
 об Обществе
члены Общества
сотрудничество
есть идеи?
музей СЗМ
компании
конференции
библиотека
скан-галерея
скан
недели
|
- Синтез гидрофобно-гидрофильных наноструктур на поверхности полимеров
с помощью углеродной низкотемпературной плазмы. А. П. Алехин,
А. Г. Кириленко, А. И. Козлитин, Р. В. Лапшин, С. Н. Мазуренко,
Поверхность. Рентгеновские, синхротронные и нейтронные исследования,
№ 11, стр. 8-11, 2006.
- Морфология поверхности тонких углеродных пленок, осажденных
из плазмы на полиэтилен низкой плотности. А. П. Алехин, А. Г.
Кириленко, Р. В. Лапшин, Поверхность. Рентгеновские, синхротронные
и нейтронные исследования, № 2, стр. 3-9, 2004.
- Исследование наноструктурированного углерода на полиэтилене.
А. П. Алехин, А. Г. Кириленко, Р. В. Лапшин, Р. И. Романов, А.
А. Сигарев, Журнал прикладной химии, том 76, вып. 9, стр. 1536-1540,
2003.
- AFM investigation of highly ordered nanorelief formation by
anodic treatment of aluminum surface. S. A. Gavrilov, V. M. Roschin,
A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin,
E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin,
Physics, Chemistry and Application of Nanostructures: Reviews
and Short Notes to Nanomeeting 2003, Editors: V. E. Borisenko,
S. V. Gaponenko, V. S. Gurin, World Scientific Publishing Ltd.,
London, UK, pp. 500-502, 2003.
- Automatic drift elimination in probe microscope images based
on techniques of counter-scanning and topography feature recognition.
R. V. Lapshin, Measurement Science and Technology, vol. 18, iss.
3, pp. 907-927, 2007.
- Автоматическая распределенная калибровка сканера зондового микроскопа.
Р. В. Лапшин, Поверхность. Рентгеновские, синхротронные и нейтронные
исследования, № 11, стр. 69-73, 2006.
- Способ автоматической коррекции искажённых дрейфом СЗМ-изображений.
Р. В. Лапшин, Симпозиум "Нанофизика и наноэлектроника",
тезисы докладов, том 1, стр. 159-160, Нижний Новгород, 25-29 Марта,
2005.
- Автоматическая распределённая калибровка сканера зондового микроскопа
Р. В. Лапшин, Симпозиум "Нанофизика и наноэлектроника",
тезисы докладов, том 1, стр. 161-162, Нижний Новгород, 25-29 Марта,
2005.
- Способ
перемещения зонда сканирующего микроскопа-нанолитографа в поле
грубого X-Y позиционера. Р. В. Лапшин, Патент РФ на изобретение,
№ 2181212, приоритет от 07.09.1999.
- Способ
измерения рельефа поверхности сканирующим зондовым микроскопом.
Р. В. Лапшин, Патент РФ на изобретение, № 2175761, приоритет от
08.06.1999.
- Способ
считывания цифровой информации в зондовом запоминающем устройстве.
Р. В. Лапшин, Патент РФ на изобретение, № 2181218, приоритет
от 02.11.1998.
- Feature-oriented
scanning methodology for probe microscopy and nanotechnology.
R. V. Lapshin, Nanotechnology, vol. 15, no. 9, pp. 1135-1151,
2004.
- Automatic
lateral calibration of tunneling microscope scanners. R. V.
Lapshin, Review of Scientific Instruments, vol. 69, no. 9, pp.
3268-3276, 1998.
- Analytical
model for the approximation of hysteresis loop and its application
to the scanning tunneling microscope. R. V. Lapshin, Review
of Scientific Instruments, vol. 66, no. 9, pp. 4718-4730, 1995.
- Fast-acting
piezoactuator and digital feedback loop for scanning tunneling
microscopes. R. V. Lapshin, O. V. Obyedkov, Review of Scientific
Instruments, vol. 64, no. 10, pp. 2883-2887, 1993.
- Surface Forces and
Adhesion. N.A. Burnham and A.J. Kulik
- Двумерные
сегнетоэлектрики (Обзор актуальных проблем). Л.М. Блинов,
В.М. Фридкин, С.П. Палто, А.В. Буне, П.А. Даубен, С. Дюшарм. Успехи
физических наук, Март 2000 г, том 170, №3, стр. 245-262.(PDF 571322
bytes)
- Нанотрибология: экспериментальные
факты и теоретические модели. Г.В. Дедков. УФН, Т.170, №6.
2000. С.585-618. (PDF 957 440 bytes).
- Electrical-conductivity
SFM study of an ultrafiltration membrane. P-J Gallo, A J Kulik,
N A Burnham, F Oulevey and G Gremaud. Nanotechnology, 8, (1997),
P. 10–13. (PDF 366 592 bytes). (Abstr.)
- Theoretical and
experimental evidence for "true" atomic resolution under
non-vacuum conditions. I. Yu. Sokolov, G. S. Henderson, F.
J. Wicks. Journ.Appl.Phys. V.86, N 10, P. 5537-5540 (1999). (Abstr.)
- Imitation
of non-contact mode while scanning in the presence of an electric
double layer? I. Yu. Sokolov, G. S. Henderson, F. J. Wicks.
Journ.Appl.Phys. Appl. Surf. Science. V. 140, (1999), P. 422-427.
(Abstr.)
- AFM
characterization of domain structure of ferroelectric TGS crystals
on a nanoscale.A.L. Tolstikhina, N.V. Belugina and S.A. Shikin.
Ultramicroscopy, Volume 82, Issue 1-4, 2000, pp. 149-152 (PDF
480113 bytes)
- Forming
and electric properties of the planar 2D-nonodimension structures.
U.A. Adamov, N.V. Korneev, V.G. Mocerov, V.K. Nevolin.
- Micromechanics
for Scanning Probe Microscopy and nanotechnology. V.A. Bykov.
- Elastic stress and composition of the autogamous nanoislets
GeSi on Si (001). N.V. Vostokov, S.A. Gusev, I.V. Dolgov, U.N.
Drozdov, Z.F. Kracilnik, D.N. Lobanov, L.D. Moldavskay, A.V. Novikov,
V.V. Postnikov, D.O. Filatov.
- Упругие
напряжения и состав самоорганизующихся наноостровков GeSi на Si
(001). Н.В. Востоков, С.А. Гусев, И.В. Долгов, Ю.Н. Дроздов,
З.Ф. Красильник, Д.Н. Лобанов, Л.Д. Молдавская, А.В. Новиков,
В.В. Постников, Д.О. Филатов. Физика и техника полупроводников,
2000, том 34, вып. 1, стр. 8-12.
(PDF 351610 bytes)
- Constructive
Nanolithography: Site-Defined Silver Self-Assembly on Nanoelectrochemically
Patterned Monolayer Templates. R. Maoz, E. Frydman, S. R.
Cohen, J. Sagiv. Advanced Materials, Volume 12, Issue 6, 2000,
pp. 424-429.(PDF 1.24 Mbytes)
- WS2 nanotubes as tips in scanning probe microscopy.
(PDF 658331 bytes) A. Rothschild, S.R. Cohen, R. Tenne.Applied
Physics Letters, Volume 75, Number 25, 20 December 1999.
- Cross-sectional
atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes.
A.V. Ankudinov, A.N. Titkov, T.V. Shubina, S.V. Ivanov, P.S. Kop'ev,
H.-J. Lugauer, G. Reuscher, M. Keim, A. Waag, G. Landwehr. Appl.Phys.Lett.
75(17), p.2626 (1999)(PDF 392594 bytes)
- A New
Lamellar Morphology of a Hybrid Amorphous/Liquid Crystalline Block
Copolymer Film. D. Sentenac, A. L. Demirel, J. Lub, and W.
H. de Jeu*. Macromolecules 1999, 32(10), 3235-3240. (PDF 1.76
Mbytes)
- Нанорельеф
окисленной поверхности скола решетки чередующихся гетерослоев
Ga0.7Al0.3As и GaAs. А.В. Анкудинов,
В.П. Евтихиев, В.Е. Токранов, В.П. Улин, А.Н. Титков. Физика и
техника полупроводников, 1999, том 33, вып. 5, стр. 594-597.(PDF
1.17 Mbytes)
- Система параметров
для анализа шероховатости и микрорельефа поверхности материалов
в сканирующей зондовой микроскопии. П.А. Арутюнов, А.Л. Толстихина,
В.Н. Демидов. "Заводская лаборатория. Диагностика материалов.",
№9, том 65, с. 27-37.
(PDF 2.11 Mbytes)
- Growth
mode study of ultrathin HTSC YBCO films on YBaCuNbO buffer.
I. Grekhov, L. Delimova, I. Liniichuk, A. Lyublinsky, I. Veselovsky,
A. Titkov, M. Dunaevsky, V. Sakharov. Physica C 324 1999 39–46.(PDF
2.37 Mbytes)
- Атомно-силовая
микроскопия в задачах проектирования приборов микро- и наноэлектроники.
Часть I. (PDF 2.43 Mbytes) П.А. Арутюнов, А.Л. Толстихина.
Микроэлектроника, 1999, том 28, № 6, с. 405-414.
- Атомно-силовая
микроскопия в задачах проектирования приборов микро- и наноэлектроники.
Часть II. П.А. Арутюнов, А.Л. Толстихина. Микроэлектроника,
1999, том 29, № 1, с. 13-22. (PDF 2.03 Mbytes)
- Reduction
of the size of the implanted silver nanoparticles in float glass
during excimer laser annealing.A.L. Stepanov, D.E. Hole, A.A.
Bukharaev, P.D. Townsend and N.I. Nurgazizov. Applied Surface
Science (136) 4 (1998) pp. 298-305. (PDF 1.17 Mbytes)
- Conductive SPM
probes of base Ti or W refractory compounds. Nanotechnology.
V. Shevyakov, S. Lemeshko, V. Roschin. 9 (1998) 352-355.(PDF 799766
bytes)
- Test
structure for SPM tip shape deconvolution. V. Bykov, A. Gologanov,
V. Shevyakov. Applied Physics A Materials Science & Processing,
Abstract Volume 66 Issue 5 (1998) pp 499-502 (PDF 310634 bytes)
- MBE growth and
characterization of ferromagnetic MnAs layers on CaF2:Si(111).
A.G. Banshchikov, M.V. Baidakova, B.P. Zakharchenya, K. Saito,
N.S. Sokolov, S.M. Suturin, M. Tanaka. Nanostractures: Physics
and Technology 97, International and Technology St.Petersburg
Russia 23-27 June 1997. (PDF 500202 bytes)
- Диагностика поверхности
с помощью сканирующей силовой микроскопии (обзор). А.А. Бухараев,
Д.Б. Овчинников, А.А. Бухараева. Заводская Лаборатория, Исследование
структуры и свойств, Физические методы исследования и контроля,
УДК 620.187:539.25, с.10-27.(PDF 4.95 Mbytes)
- Langmuir-Blodgett
films and nanotechnology. V.A. Bykov. Biosensor & Bioelectronics
Vol. 11, No. 9, pp. 923-932, 1996.(PDF 1.68 Mbytes)
- Investigation
of Langmuir Films of Fullerene Derivative Resulting by Addition
of C60 to Tetracyanoethylene Oxide. V.R. Novak, S.L. Vorob'eva,
and I.V. Myagkov. Mol .Mat., Vol. 7, pp. 175-178, 1996. (PDF 286073
bytes)
- Characterization
of GaAs/GaAlAs MOCVD Superlatice by STM/AFM Technique. Russian
Academy of Siences. V.A. Fedirko, V.A. Bykov, M.D. Eremtchenko,
V.I. Shashkin and V.M. Daniltzev. Abstracts of Invited Lectures
and Contributed Papers, St Petersburg, Russia, 24-28 June 1996,
pp.. 381-384.(PDF 235385 bytes)
- Исследование
микрорельефа поверхности кристаллов сегнетоэлектриков ТГС и Rb2ZnCl2
методов атомно-силовой микроскопии. Н.В. Белугина, А.Л. Толстихина.
Кристаллография, 1996, том 41, №6, с. 1072-1076.(PDF 1.25 Mbytes)
- Scanning
tunneling microscopy investigation offtillerene monolayers.V.A.
Fedirko, V.A. Bykov and M.D. Eremchenko. Fresenius Journ. of Analytical
Chemistry, 1996, v. 355, N 5-6, p. 707-710. (PDF 399789 bytes)
- Spectroscopic
study of nickel(II) hydroxide surface modifications induced by
a small iron(III) addition. Alexander A. Kamnev, Alexander
A. Smekhnov. Fresenius Journ. of Analytical Chemistry, 1996, v.
355, N 5-6, p. 710-712.
(PDF 385763 bytes)
- Создание
и структурное исследование тонких пленок лизоцима. Р.Л. Каюшина,
Н.Д. Степина, В.В. Беляев, Ю.И. Хургин, А.Л. Толстихина, В.В.
Клечковская. Тезисы I конф. по высокоорганизованным соед., Июнь
1996 г. стр. 237-238.(PDF 228299 bytes)
- Моно- и
мультимолекулярные слои из смешанных сложных эфиров целлюлозы,
полученных и использованием трифторуксусной кислоты. А.К.
Хрипунов, Ю.Г. Баклагина, В.М. Денисов, А.Я. Волков, В.К. Лаврентьев,
Н.В. Цветков, А.В. Сидорович, Н.Д. Степина, В.В. Клечковская,
Л.Г. Янусова, А.Л. Толстихина, В.В. Беляев, Л.А. Фейгин. Тезисы
I конф. по высокоорганизованным соед., Июнь 1996 г. стр. 332-334.(PDF
355917 bytes)
- Особенности
структуры аморфных пленок оксида титана в зависимости от условий
получения. А.Л. Тостихина, К.Л. Сорокина. Кристаллография,
1996, том 41, № 2, с.339-347.(PDF 1.93 Mbytes)
- Scanning
tunneling and atomic force microscopy of surface modified by ion
and laser beams. A.A. Bukharaev. Physics-Uspekhi 1996, v.39.
N2, P.193-196.(PDF 1021871 bytes)
- Atomic
force microscopy of laser induced sub-micrometer periodic structures
on implanted fused silica and silicon. A.A. Bukharaev, V.M.
Janduganov, E.A. Samarsky, N.V. Berdunov. Applied Surface Science
103 (1996) 49-54.(PDF 1.02 Mbytes)
-
Heat stable Langmuir-Blodgett film of Glutathione-S-Transferase.
F. Antolini, S. Paddeu, C. Nicolini. Langmuir 1995, 11, 2719-2725.(PDF
1.39 Mbytes)
- High-sensitivity
biosensor based on LB technology and on nanogravimetry. C.
Nicolini, M. Adami, T. Dubrovsky, V. Erokhin, P. Facci, P. Paschkevitsch,
M. Sartore. Sensors and Actuators B 24-25 (1995) 121-128.(PDF
1022812 bytes)
- Thermal
stability of bipolar lipid Langmuir Blodgett films by X-ray diffraction.
S. Dante, M. De Rosa, E. Maccioni, A. Morana, C. Nicolini, F.
Rustichelli, V.I. Troitsky, B. Yang. Mol. Cryst. liq. Cryst. 1995,
Vol. 262, pp. 191-207.(PDF 1.28 Mbytes)
- Deposition
of uniform fullerene films by LB technique. T.S. Berzina,
V.I. Troitsky, O.Ya. Neilands, I.V. Submale, C. Nicolini. Thin
Solid Films, 256 (1995) 186-191.(PDF 1.07 Mbytes)
- Observation
of room temperature mono-electron phenomena on nanometre-sized
CdS partices. V. Erokhin, P. Facci, S. Carrar, C. Nicolini.
J. Phys. D: Apll. Phys. 28 (1995) 2534-2538. Printed in the UK
N12.(PDF 985422 bytes)
- Immunological
activity of IgG Langmuir films oriented by protein A sublayer.
T. Dubrovsky, A. Tronin, S. Dubrovskaya, S. Vakula, C. Nicolini.
Sensors and Actuators B 23 (1995) 1-7.(PDF 1.27 Mbytes)
- Conducting
Langmuir-Blodgett films of heptadecylcarboxymethyl-BEDT-TTF.
V.I. Troitsky, T.S. Berzina, Ya.Ya. Katsen, O.Ya. Neilands, C.Nicolini.
Synthetic Metals 74 (1995) 1-6.(PDF 1.10 Mbytes)
- X-ray diffraction
structural analysis of Langmuir-Blodgett films using a pattern
recognition approach. E. Maccioni, P. Mariani, F. Rustichelli,
H. Delacroix, V.Troitsky, A. Riccio, A. Gambacorta, M.De Rosa.
Thin Solid Films, 265 (1995) 74-83.(PDF 1.67 Mbytes)
- Langmuir-Blodgett
films of bipolar lipids from thermophilic archaea. T.S. Berzina,
V.I. Troitsky, S. Vakula, A. Riccio, A. Morana, M. De Rosa, S.
Dante, E. Maccioni, F. Rustichelli, P. Accossato, C. Nicolini.
Materials Science and Engineering: C 3 (1995) 13-21.(PDF 1.80
Mbytes)
- Deposition
of Langmuir-Blodgett alternating bilayers of valinomycin and chemically
modified bipolar lipid from archaea. T.S. Berzina, V.I. Troitsky,
S. Vakula, A. Riccio, A. Morana, M. De Rosa, L. Gobbi, F. Rustichelli,
V.V. Erokhin, C. Nicolini. Materials Science and Engineering:
C 3 (1995) 33-38.(PDF 1.11 Mbytes)
- Langmuir-Blodgett
multilayers of native and synthetic glycerol-dialkyl-glycerol
tetraether derivatives from archaea. T.S. Berzina, V.I. Troitsky,
S. Vakula, A. Riccio, A. Gambacorta, M.De Rosa, L.Gobbi, F. Rustichelli,
V.V. Erokhin, C. Nicolini. Materials Science and Engineering:
C 3 (1995) 23-31.(PDF 1.73 Mbytes)
- Сканирующая
зондовая микроскопия дифракционных решеток, сформированных лазерных
излучением. А.А.Бухараев, В.С.Лобков, В.М.Яндуганов, Е.А.Самарский,
Н.В.Бердунов. Оптика и Спектроскопия, 1995, том 79, N3, с.417-425.(PDF
1.79 Mbytes)
- Formation
of Ultrathin Semiconductor Films by CdS Nanostructure Aggregation.
P. Facci, V. Erokhin, A. Tronin, C. Nicolini. J. Phys. Chem. 1994,
98, 13323-13327.(PDF 1.08 Mbytes)
- Scanning
tunnelling microscopy of a monolayer of reaction centres.
P. Facci, V. Erokhin, C. Nicolini. Thin Solid Films, 243 (1994)
403-406.(PDF 815599 bytes)
- Surface
potential studies of monolayers of surfactant donor and acceptor
molecules.F. Rustichelli, S. Dante, P. Mariani, I.V. Myagkov,
V.I. Troitsky. Thin Solid Films, 242 (1994) 267-272. (PDF 866154
bytes)
- Reversed
micellar approach as a new tool for the formation and structural
studies of protein Langmuir-Blodgett films. V. Erokhin, S.
Vakula, C. Nicoloni. Thin Solid Films, 238 (1994) 88-94.(PDF 914727
bytes)
- Langmuir-Blodgett
films of immunoglobulines IgG. Ellipsometric study of the deposition
process and of immunological activity. A. Tronin, T. Dubrovsky,
C.De Nitti, A. Gussoni, V. Erokhin, C. Nicoloni. Thin Solid Films,
238 (1994) 127-132.(PDF 1008948 bytes)
- Scanning
tunneling microscopy imaging of conducting Langmuir-Blodgett films.
M. Male, E. Stussi, D.De Rossi, T.S. Berzina, V.I. Troitsky. Thin
Solid Films, 237 (1994) 225-230.(PDF 1.07 Mbytes)
- Nanogravimetric
gauge for surface density measurements and deposition analysis
of Langmuir-Blodgett films. P. Facci, V. Erokhin, C. Nicolini.
Thin Solid Films, 230 (1993) 86-89. (PDF 476977 bytes)
- Thermal
stability of protein secondary structure in Langmuir-Blodgett
films. C. Nicolini, V. Erokhin, F. Antolini, P. Catasti, P.
Facci. Biochimica et Biophysica Acta, 1158 (1993) 273-278.(PDF
869062 bytes)
- Conducting
Langmuir-Blodgett films of hexadecyl-BEDT-TF charge-transfer salts
with inorganic compounds.T.S. Berzina, V.I. Troitsky, E. Stussi,
M. Mule, D.De Rossi. Synthetic Metals, 60 (1993) 111-114. (PDF
826650 bytes)
- The
influence of structure change on electrical properties of conducting
LB films produced from HEXADECYL-TCNQ and HEPTADECYLDIMETHYL-TTF
Mixture. T.S. Berzina, S.A. Shikin, V.I. Troitsky. Makromol.
Chem., Macromol. Symp. 46, 223-227 (1991).(PDF 573960 bytes)
- The use
of SIMS, XPS, and in situ AFM to probe the acid catalysed hydrolysis
of poly(orthoesters). S.R. Leadley, K.M. Shakesheff, M.C.
Davies, J. Heller, N.M. Franson, A.J. Paul, A.M. Brown, J.F.Watts.
Biomaterials, 19, (1998), 1353-1360.
- Morphological
analysis of stainless steel scale like surface morphology using
STM and AFM. V.Viginal, J.C. Roux, J.M.Olive, D. Desjardins,
V. Genton. Acta mater. Vol.46, No.1, pp.149-157,1998.
- A new approach
to pH of poin tof zero charge measurement: Crystal-face specificity
by scanning force microscopy (SFM). C.M. Eggleston, G. Jordan.
Geochimica et Cosmochimica Acta,Vol.62, No.11, pp.1919-1923,1998
- Imaging
the atomic-scale structure of vanadia powder surface using ambient
atomic force microscopy. C. Mathieu, S. Peґralta, A. DaCosta,
Y. Barbaux. Surface Science, 395, (1998), L201-L206
-
Effect of tip sharpness on the relative contributions of attractive
and repulsive forces in the phase imaging of tapping modeatomic
force microscopy. G. Bara, R.Brandscha, M.-H. Whangbo. Surface
Science, 422, (1999), L192-L199.
- Miscibility
and surface crysta lmorphology of blends containing poly(vinylidene
uoride) by atomic force microscopy. Won-Ki Lee, Chang-Sik
Ha. Polymer, Vol.39, No.26, pp.7131-7134,1998.
- Study
on surface structure of amorphous polyme rblends on the basis
of latera lforce microscopy. Won-Ki Lee. Polymer, 40, (1999),
5631-5636.
- Measurement
of surface roughness by atomic force microscopyand Rutherford
backscattering spectrometry of CdSnanocrystalline films.
K.K. Nanda, S.N. Sarangi, S.N. Sahu. Applied Surface Science,
133, 1998, 293-297.
- Surface
morphology, chemical contrast, and ferroelectric domains in TGS
bulk single crystals differentiated with UHV non-contact force
microscopy. L.M. Enga, M. Bammerlina, Ch. Loppachera, M. Guggisberga,
R. Bennewitza. Applied Surface Science, 140, 1999, 253-258.
- Determination
of tip-sample interaction forces from measureddynamic force spectroscopy
curves. B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs.
Applied Surface Science, 140, 1999, 314-319.
- How to measure
energy dissipation in dynamic mode atomicforce microscopy.
B. Anczykowski, B. Gotsmann, H. Fuchs, J.P. Cleveland, V.B. Elings.
Applied Surface Science, 140, 1999, 376-382
- Ar plasma treated
and A metallised polycarbonate: a XPS, massspectroscopy and SFM
study. C. Seidela, H. Kopfa, B. Gotsmanna, T. Vietha, H.
Fuchs, K. Reihs. Applied Surface Science, 150, 1999,19-33.
- Measurement of
surface defects on thin steel wires by atomicforce microscopy.
L.M. Sanchez-Brea, J.A. Gomez-Pedrero, E.Bernabeu. Applied
Surface Science, 150, 1999, 125-130
- Microscopy (AFM,
TEM, SEM) studies of oxide scale formation on FeCrAl based ODS
alloys. A. Czyrska-Filemonowicz, K. Szot, A. Wasilkowska,
A. Gil, W.J. Quadakkers Solid State Ionics, 117, (1999), 13-20.
- An AFM study
of the properties of passive films on iron surfaces. Jing
Li, D.J. Meier. Journal of Electroanalytical Chemistry, 454, (1998),
53-58.
- AFM studies of
the nucleation and growth mechanisms of macromolecular crystals.
Yu.G. Kuznetsov, A.J. Malkin, A. McPherson. Journal og Crystal
Growth, 196, (1999), 489-502.
- Microtribological
behavior of Au(001) studied by AFM/FFM. C. Polaczyk, T. Schneider,
J. SchoЁfer, E. Santner. Surface Science, 402-404, (1998), 454-458.
- Hysteresis generated
by attractive interaction: oscillating behavior of a vibrating
tip-microlever system near a surface. R. Boisgarda, D.Michelb,
J.P. Aimeґa. Surface Science, 401, (1998), 199-205
- Scanning tunneling
microscope-induced molecular motion and its effect on the image
formation. M. Bohringera,W.-D. Schneidera, R. Berndtb. Surface
Science, 408, (1998), 72-85.
- Atomic force
microscopy investigation of the surface topography and adhesion
of nickel nanoparticles to submicrospherical silica. S. Ramesh,Y.
Cohen, D. Aurbach, A.Gedanken. Chemical Physics Letters, 287,
1998, 461-467.
- The adsorption
of n-dodecane and n-pentane onto highlyoriented pyrolytic graphite
studied by atomic force microscopy. D.S. Martina, P. Weightmana,
J.T. Gauntlettb. Surface Science, 424, (1999), 187-198.
- Nanostructure
of Ge deposited on Si(100): a study by XPS peak shape analysis
and AFM A.C. Simonsen, M. Schleberger, S. Tougaard, J.L. Hansen,
A. N. Larsen. Thin Solid Films, 338, (1999), 165-171.
- AFM characterisation
of the structure of Au-colloid monolayersand their chemical etching.
A. Doron, E. Joselevich, A. Schlittner, I. Willner. Thin
Solid Films, 340, (1999), 183-188.
- Probing the surface
forces of atomic layered SrTiO3 films by atomic force microscopy.
H. Tanaka, H. Tabata, T. Kawai. Thin Solid Films, 342, (1999),
4-7.
- Lateral force
microscopy study of functionalized self-assembled monolyer.
Yin Kim, Kwang-Salk Kim, Mingyu Park, Jaein Jeong. Thin Solid
Films, 341, (1999), 91-93.
- Recovery and
amplification of plasmid DNA with atomic force microscopy and
the polymerase chain reaction. Xue-Ming Xu, Atsushi Ikai.
Analitica Chimica Acta, 361, (1998), 1-7.
- Immobilization
strategies for biological scanning probe microscopy. Peter
Wagner. FEBS Letters, 430, (1998), 112-115.
- Ultrahigh vacuum
magnetic force microscopy: domain imaging on in situ grown Fe(100)
thin films. U. Memmert, P. Leinenbach, J. Losch, U. Hartman.
Journal of Magnetism and Magnetic Materials, 190, (1998), 124-129.
- Surface characterisation
of ethilene-vinyl acetete (EVA) and ethylene-acrylic acid (EAA)
co-polymers using XPS and AFM. R. L. McEvoy, S. Krause, P.
Wu. Polymer, Vol. 39, No 21, pp. 5223-5239, 1998.
- Comparison of
atomic force microscope and Rutherford backscattering spectrometry
data nanometre size zinc islands M.F. Tabet, F.K. Urban III.
Thin Solid Films, 290-291, (1996), 312-316.
- Nanoscale mechanical
property measurements using modified atomic force microscopy.
A.V. Kulkarni, B. Bhushan. Thin Solid Films, 290-291, (1996),
206-210.
- Surfaces coated
with protein layers: a surface force and ESCA study. E. Blomberg,
P.M. Claesson, J. C. Froberg. Biomaterials, 19, (1998), 371-386.
- Characterisation
of polyacrylonitrile films grafted onto nickel by ellipsometry,
atomic force microscopy and X-ray reflectivity. C. Calberg,
M. Mertens, R. Jerome, X. Arys, A.M. Jonas, R. Legras. Thin Solid
Films, 310, (1997), 148-155.
- Scanning force
microcopy simlations of well-characterized nanostructures on dielectric
and semiconducting substrates. F. Touhari, X. Bouji, C. Girard,
M. Devel, G. Cohen-Solal. Applied Surface Science, 125, (1998),
351-359.
- An atomic force
microscopy study of the molecular organisation of xanthan.
I. Capron, S. Alexandre, G. Muller. Polymer, Vol. 39, No 23, pp.
5725-5730, 1998.
- Study of the
surface glass transition behaviour of amorphous polymer film by
sacnning-force microscopy and surface spectroscopy. I. Capron,
S. Alexandre, G. Muller. T. Kajiyama, K. Tanaka, A. Takahara.
Polymer,Vol. 39, No 19, pp. 4665-4673, 1998.
- Micro/nanoscale
friction and wear mechanisms of thin films using atomic force
and friction force microscopy. B. Bhushan, S. Sundararajan.
Acta mater., Vol. 46, No 11, pp. 3793-3804, 1998.
- Ultrasharp diamond-coated
silicon tips for scanning-probe devices. E.I. Givargizov,
A.N. Stepanova, E.S. Mashkova, V.A. Molchanov, F. Shi, P. Hudek,
I.W. Rangelow. Microelectronic Engineering, 41/42, (1998), 499-502.
- Atomic and chemical
resolution in scanning force microscopy on ionic surfaces. A.I.
Livshits, A.L. Shluger. Applied Surface Science, 141, (1999),
274-286.
- Dependence of
the measured monolayer height on applied forces in scanning force
microscopy. M. Hartig, L.F. Chi, X.D. Liu, H. Fuchs. Thin
Solid Films, 327-329, (1998), 262-267.
- Force titration
of amino group-terminated self-assembled monolayers of 4-aminothiophenol
on gold using chemical force microscopy. Hua Zhang, Hui-Xin
He, Tao Mu, Zhong Fan Liu. Thin Solid Films, 327-329, (1998),
778-780.
- Charactrisaton
of conductive molecular films on silicon: Auger electron spectroscopy,
X-ray photoelectron spectroscopy, atomic force microscopy and
surface photovoltage. A. Komolov, K. Schaumburg, P.J. Moller,
V. Monachov. Applied Surface Science, 142, (1999), 591-597
- Local mechanical
spectroscopy with nanometer-scale lateral resolution. F.Oulevey,
G.Gremaud, A.Se_moroz, A.J.Kulik, N A.Burnham, E.Dupas, D.Gourdon.
Review of scientific instruments. V. 69. 5 MAY. 1998.P.2085-2094.
- Surface Forces
and Adhesion. N.A. Burnham and A.J. Kulik
- Scanning local-acceleration
microscopy. N. A. Burnham, A. J. Kulik, G. Gremaud, P.-J.
Gallo, and F. Oulevey.
- JVST B - Microelectronics and Nanometer Structures. 1996.
- Electrical Testing
of Gold Nanostructures by Conducting Atomic Force Micriscopy.
Res.Rep. IBM & Cambr.Un.
- How does a tip tap?
N.A.Burnham,O.P.Behrend, F.Oulevey, G.Gremaud, P-J.Gallo, D.Gourdon,
E.Dupas, A.J.Kulik, H.M.Pollock. G.A.D.Briggs. Nanotechnology.
V.8. 1997. P.67-75.
- Development of contact
scanning probe lithography methods forfabrication of lateral nanodimensional
elements.V.F. Dryakhlushin, A.Yu. Klimov, V.V. Rogov, V.I.
Shashkin*, L.V. Sukhodoev, D.G. Volgunov, and N.V. Vostokov. (Конкурс
NT-MDT/NANOWORLD 1999).
- Изучение с помощью
атомно-силового микроскопа in situ кинетики жидкостного химического
травления субмикронных пленок диоксида кремния А. А. Бухараев,
Н. И. Нургазизов, А. А. Можанова, Д. В. Овчинников. (Конкурс NT-MDT
/NANOWORLD 1999).
- Growth of InAs quantum
dots and GaAs cap-layers by MOVPEV. I. Shashkin, V. M. Danil'tsev,
Yu. N. Drozdov, O. I. Khrykin, A. V. Murel, and N. V. Vostokov.
(Конкурс NT-MDT/NANOWORLD 1999).
- Growth of InAs
quantum dots and GaAs cap-layers by MOVPE
- Нанорельеф окисленной
поверхности скола решетки чередующихся гетерослоев Ga0:7Al0:3As
и GaAs. А.В. Анкудинов, В.П. Евтихиев, В.Е. Токранов, В.П.
Улин, А.Н. Титков. Физика и техника полупроводников, 1999, том
33, вып. 5. (Конкурс NT-MDT/NANOWORLD 1999).
- AFM characterisation
of domain structure of ferroelectric TGS crystals on a nanoscaleA.L.Tolstichina,
N.V.Belugina, S.A.Shikin. Ultramicroscopy 1999. (Конкурс NT-MDT/NANOWORLD
1999).
- Система параметров
для анализа шероховатости и микрорельефа поверхности материалов
в сканирующей зондовой микроскопиию П.А.Арутюнов. А.Л.Толстихина,
В.Н.Демидов. Заводская лаборатория.Диагностика материалов. Т.
65. № 9. (Конкурс NT-MDT/NANOWORLD 1999).
- MBE-growth peculiarities
of fluoride (CdF2-CaF2) thin film structures.N.S.Sokolov,
S.M.Suturin. (Конкурс NT-MDT/NANOWORLD 1999).
- Manganese Fluoride
Epitaxial Growth on Si(111)O.V. Anisimov, A.G. Banshchikov,
A.V. Krupin, M.M. Moisseeva, N.S. Sokolov, V.P. Ulin, N.L. Yakovlev.
(Конкурс NT-MDT/NANOWORLD 1999).
- Исследование неоднородностей
в Y-Ba-Cu-O тонких пленках методами сканирующей зондовой микроскопии.
А. К. Воробьев, Н. В. Востоков, С. В. Гапонов, Е. Б. Клюенков,
В. Л. Миронов. (Конкурс NT-MDT/NANOWORLD 1999).
- GROWTH MODE STUDY
OF ULTRATHIN HTSC YBCO FILMS ON YBaCuNbO BUFFER . . I.Grekhov,
L.Delimova, I.Liniichuk, A.Lyublinsky, I.Veselovsky, A.Titkov,
M.Dunaevsky, V.Sakharov . (Конкурс NT-MDT/NANOWORLD 1999).
Sections
SPM based Storage
- Digital
data readback for a probe storage device. R. V. Lapshin, Review
of Scientific Instruments, vol. 71, no. 12, pp. 4607-4610, 2000.
- "Millipede"
- An AFM Data Storage System at the Frontier of Nanotribology.
U. Duerig, G. Cross, M. Despont, U. Drechsler, W. Haeberle, M.I.
Lutwyche, H. Rothuizen, R. Stutz,
R. Widmer, P. Vettiger, G.K. Binnig, W.P. King, and K.E. Goodson.
- Ultrahigh density,
high-data-rate NEMS-based AFM data storage system. P.Vettiger,
J.Brugger, M.Despont et all. Microelectronic Engineering. V. 46.
(1999). P. 11-17.
- 5x5 2D AFM cantilever
arrays a first step towards a Terabit storage device.M.Lutwyche,
C.Andreoli, G.Binnig, J.Brugger, U.Drechsler, W.Haberle, H.Rohrer,
H.Rothuizen, P.Vettiger, G.Yaralioglu, C.Quate. Sensors and Actuators.
V.73. 1999. P.89-94.
- 6.6 MHz silicon
AFM cantilever for high-speed redout in AFM-based recording.S.Hosaka,
K.Etoh, A.Kikukava et all. Microelectronic Engineering. V. 46.
(1999). P. 109-112.
- Ultra high density
data storage on phase change materials with electrical micro-tips.
D.Saluel, J.Daval, B.Bechevet, C.Germain, B.Valon. Journal of
Magnetism and Magnetic Materials. V.193. 1999. P. 488-491.
- A Highly Parallel
Data Storage System Based on Scanning Probe Arrays.
M. I. Lutwyche, M. Despont, U. Drechsler, U. D. urig, W. H.aberle,
H. Rothuizen, R. Stutz, R.Widmer, G. K. Binnig and P. Vettiger.
- Nanometre-scale oxidation
of silicon surfaces by dynamic force microscopy: reproducibility,
kinetics and nanofabrication. M. Calleja, J. Anguita, R. Garcia,
К. Birkelund, F. Perez-Murano and J.A. Dagata.
Nanoelectronic
SPM based Nanotechnology
& related topics
- Technology
for nanoelectronic devices based on ultra-high vacuum scanning
tunneling microscopy on the Si(100) surface. G.Palasantzas,
B.Ilge, S.Rogge et all. Microelectronic Engineering. V. 46. (1999).
P. 133-136.
- Metal deposition
near the tip of a scanning tunneling microscope. J.Divisek,
B.Steffen, U.Stiming, W.Schmicker. Journ. of Electroanalytical
Chemistry. V. 440. 1997. P.169-172.
- Current-dependent
growth of silicon nitride lines using a conducting tip AFM
R.K. Workman, C.A. Peterson, D. Sarid .Surface Science. V.423.
1999.L277-L279.
- Scanning probe
lithography for electrode surface modification. H.Sugimura,
O.Takai, N.Nakagiri. Journal of Electroanalytical Chemistry. V.473.1999.P.230-234.
- Dynamic oxide
interfaces by microscopic techniques at high resolutions.
Y. Iwasawa. Surface Science.V.402-404.1998.P.8-19.
- Field induced
oxidation of silicon by SPM: study of the mechanism at negative
sample voltage by STM, ESTMand AFM. G.Abadal, F.P'erez-Murano,
N.Barniol, X.Aymerich. Appl.Phys.A. V.66. 1998. S791-S795.
- Electrochemical
nanostructuring. D.M.Kolb, R.Uiimann, J.C.Ziegler. Electrochimica
Acta. V. 43. Nos. 19-20. 1998. P. 2751-2760.
- Nanolithography
by local anodic oxidation om metal films using an atomic force
microscope. R.Held, T.Neinzel, PStuderus, K.Ensslin.Physica
E. V.2. 1998. P.748-752.
- NASA applications
of molecular nanotechnology. A.Globus, D.Bailey, J.Han, R.Jaffe,
C.Levit, R.Merkle, D.Srivastava.Journal of the British Interplanetary
Society. V.51. 1998. P.145-152.
- Nanometer scale
lithography on silicon, titanium and PMMA resist using scanning
probe microscopy. E.Dubois, J.-L.Bubbendor. Solid-State Electronics.
V. 43. 1999. P.1085-1089.
Общефизическая и научно-популярная
литература.
|
|
