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EBD

ECM

    Eddy Current Microscopy
    A sensitive scanning force microscope based technique for measuring local variations in resistivity by monitoring changes in the eddy current induced damping of a cantilever with a magnetic tip oscillating above a conducting sample.
    Appl. Phys. Lett. 78, 383 (2001).

EC SPM

EFM

    Electrostatic Force Microscopy
    EFM is based on the dual pass scheme. The grounded tip first acquires the surface topography using standard intermittent contact atomic force microscopy (IC-AFM). Electrostatic data are collected above the surface. In EFM, the cantilever is driven mechanically and the electro-static force F between the dc biased conductive tip and the surface results in a change of the cantilever resonant frequency that is proportional to the force gradient

    Dw=(wo/2k) (dF(z)/dz)

    where k is the spring constant and w o is the resonant frequency of the cantilever. Resonance is maintained by adjusting the driving frequency w p and the frequency shift Dw= wp- wo is collected as the EFM image.
    Phys. Rev. B 63, 125411 (2001).

    Electric Force Microscopy

    An a.c.voltage, U,
    U=Uwsin(w t)
    of radian frequency, w, is present between the electrically conductive tip of the microscope and the electrode at the back of the sample. Both electrostatic forces (so-colled "Maxwell stress ") and electromechanically induced forces act on the tip. An oscillating electric field causes thickness vibrations of the sample due to electrome-chanical effects (inverse piezoelectric effect and electrostriction).
    Surf. Sci. 415, 178 (1998).

EFMM

error signal mode

    Error signal mode produces an image that approximates the derivative of C-AFM topographic images, yielding high image contrast and enhancing surface and sub-surface details.
    http://www.park.com/apps/lifesci/lifesci07

ESFM