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• Research
  • Miniature “walker” type XY‑nanopositioner
  • Characterization of carbon nanotubes
  • Method and test structure for AFM‑measurements of nanometer thick water films
  • Polymer surface treatment in vacuum ultraviolet
  • Drift‑insensitive distributed calibration of probe microscope scanner
  • Drift elimination based on counter‑scanned images
  • Feature‑oriented scanning
  • Feature‑oriented positioning
  
  
• Publications
  • Selected publications
    • Automatic drift elimination in probe microscope images based on techniques of counter‑scanning and topography feature recognition
    • Feature‑oriented scanning methodology for probe microscopy and nanotechnology
    • Object‑oriented scanning for probe microscopy and nanotechnology
    • Digital data readback for a probe storage device
    • Automatic lateral calibration of tunneling microscope scanners
    • Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope
    • Fast‑acting piezoactuator and digital feedback loop for scanning tunneling microscopes
  • Complete list of papers
  • Complete list of reports
  
  
• Patents
  • Method of correction of surface images obtained using scanning probe microscope and distorted with drift
  • Method of automatic distributed calibration of probe microscope scanner
  • Procedure of movement of sonde of scanning microscope‑nanolithograph in field of coarse X‑Y positioner
  • Method for measuring surface relief by means of scanning probe type microscope
  • Method for reading digital information in probe memory device
  
  
• Gallery
  • Poly(methyl methacrylate) film nanostructured in oxygen plasma
  • Carbon film plasma‑deposited on polyurethane
  • Carbon clusters plasma‑deposited on low‑density polyethylene substrate
  • Hollows in the aluminum substrate formed after removing porous alumina
  • Mechanical indentation of silicon probe in copper thin film
  • Mechanical indentation of silicon probe in aluminum foil
  • Nanostructured surface of electrochemically polished aluminum foil
  • Surface microstructuring at low vacuum condensation of aluminum vapours
  • Electrochemically etched ordered pores in alumina
  • Through ordered pores in alumina membrane
  • Disordered array of pores in alumina membrane
  • Quasiordered array of opal balls on silicon substrate
  • Ordered array of opal balls on silicon substrate
  • Gold‑covered ordered array of opal balls
  • Ordered areas of nonspherical opal particles
  • Carbon clusters plasma‑deposited on electron resist substrate
  • Silicon surface submicron structuring induced by oxygen adsorption
  
  
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