• I am searching for partner(s) interested in further development and/or commercialization of the feature-oriented scanning (FOS) methodology applicable for both scanning probe microscopy and bottom-up nanofabrication. Contact me if you have any questions, comments or research/business proposals related to such collaboration
• I have some patentable thoughts and know-how on construction and control methods of a miniature XY nanopositioner of “walker” type. The invented positioner is free of its predecessor's drawbacks such as: x, y, z position instabilities, undesired rotation in the sample plane and sticking, all due to microroughnesses and pollutions in the contact area of electrostatic supports. Another advantage of the suggested positioner consists in its full compatibility with the feature-oriented scanning (FOS) approach. Both ambient and UHV arrangements are possible. Due to a low weight and small dimensions, the proposed nanopositioner may be incorporated in many instruments like SPM, SEM, FIB, Auger, etc. This nanopositioner is mounted instead of a sample and the sample itself is mounted on top of the nanopositioner. Contact me if you have a concern in joint development, testing and following production of such nanopositioner
• Take a look at the Patents section where several high-end measurement techniques are presented applicable to scanning probe microscopy and bottom-up nanotechnology. Your requests for licensing are welcome. Click here to establish a contact

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Related links:

• Electronic library, the Russian Society of Scanning Probe Microscopy and Nanotechnology, Russian Federation
• Electronic library, Molecular Devices and Tools for Nanotechnology Company, Russian Federation
• Institute of Physical Problems, Moscow branch of the Russian Society of Scanning Probe Microscopy and Nanotechnology
• Personal page, the Institute of Physical Problems, Russian Federation (click here to access this page in Russian)
• Profile, Scribd
• Interview, the Institute of Physics, United Kingdom
• User page, Wikipedia (click here to access this page in Russian)
• Feature-oriented scanning, Wikipedia (click here to access this entry in Russian)
• Feature-oriented positioning, Wikipedia (click here to access this entry in Russian)
• Counter-scanning, Wikipedia (click here to access this entry in Russian)

Contact information:

Dr. R. V. Lapshin, Staff Scientist
Solid Nanotechnology Laboratory
Institute of Physical Problems named after F. V. Lukin
State Scientific Center of Russian Federation
Zelenograd, Moscow, 124460
Russian Federation

tel (lab): +7 (495) 536-9379, 536-9308, 536-9324

tel (office): +7 (495) 531-9843

fax (office): +7 (495) 531-4656, 531-5592

pri email: rlapshin@yahoo.com

sec email: rlapshin@gmail.com

web (office): http://www.niifp.ru

web (personal): http://www.niifp.ru/staff/lapshin/en
web (personal): http://www.nanoworld.org/homepages/lapshin

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Sponsors

• Russian Society of Scanning Probe Microscopy and Nanotechnology
• Molecular Devices and Tools for Nanotechnology Company
• Russian Foundation for Basic Research

Credits

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Notes

• Webpages contain some documents in Russian and links to Russian websites, some search results may also be in Russian
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• Last updated on August 15, 2008