• April 2007 – “As a noted and eminent professional in science”, Dr. R. V. Lapshin has been selected for inclusion in the Leading Scientists of the World, 2007 – a renowned international biographical reference book administrated by the International Biographical Centre, Cambridge, UK
• March 2007 – The article “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, by R. V. Lapshin has been published in journal of Measurement Science and Technology. The article suggests a simple but effective method intended for correction of drift-distorted SPM scans. The obtained results should be interesting for those who operate or develop scanning probe instruments such as STM, AFM, SPM, MFM, SNOM or SEM. It is important that the method may be easily embedded in feature-oriented scanning permitting to notably improve its precision and performance
• March 2007 – “As a noted and eminent professional in engineering”, Dr. R. V. Lapshin has been selected for inclusion in the Leading Engineers of the World, 2007 – a renowned international biographical reference book administrated by the International Biographical Centre, Cambridge, UK
• February 2007 – The encyclopedia entries in English “Feature-oriented scanning”, “Feature-oriented positioning” and “Counter-scanning” are inserted in Wikipedia, the Free Encyclopedia
• February 2007 – Drift-free Scanning Probe Microscopy (SPM) Measurements at Room Temperature, Research News, the National Nanotechnology Initiative (NNI). When measuring topography and surface properties with probe instruments in nanometer scale at room temperature, drift of the probe relative to the sample surface is an important issue of the measurements precision. A simple but effective method based on counter-scanning was suggested in the Solid Nanotechnology Laboratory, the Institute of Physical Problems, Moscow, Russian Federation to correct this drift influence. The results are relevant for those operating or developing scanning probe instruments. Read more
• January 2007 – The encyclopedia entries in Russian “Feature-oriented scanning”, “Feature-oriented positioning” and “Counter-scanning” are inserted in Wikipedia, the Free Encyclopedia
• November 2006 – The article “Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma”, by A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko has been published in the Journal of Surface. The article describes a new technology permitting a low-temperature polymer modification in carbon plasma. This work is aimed to fabricate a biocompatible coating of alternating hydrophobic-hydrophilic nanostructures
• November 2006 – The article “Automatic distributed calibration of probe microscope scanner”, by R. V. Lapshin has been published in the Journal of Surface. This article is dedicated to a method eliminating all systematic measurement errors of the scanner such as static nonlinearities, nonorthogonality, and parasitic crosstalk couplings at once. The proposed method is based on the feature-oriented scanning-positioning approach
• September 2006 – The Federal Service for Intellectual Property, Patents and Trademarks (Rospatent) has decided to issue a patent “Method for automatic distributed calibration of probe microscope scanner” to R. V. Lapshin, the author of invention
• September 2006 – “As one of the most accomplished people in his professional field”, Dr. R. V. Lapshin was included in Who's Who in Science and Engineering®, 9th Edition, 2006-2007 – an exclusive international directory of biographical data published by the Marquis Who's Who LLC, New Providence, USA
• July 2006 – Application for patent “Method for correction of drift-distorted surface images obtained with scanning probe microscope”, inventor R. V. Lapshin has been resubmitted to the Federal Service for Intellectual Property, Patents and Trademarks (Rospatent) after reformulation and correction of detected errors
• April 2006 – Interview “60 seconds with …” conducted by Laura Shaw, the Institute of Physics, Bristol, UK with Dr. R. V. Lapshin, author of the paper “Feature-oriented scanning methodology for probe microscopy and nanotechnology” which has been deemed by peer review to be of top quality
• January 2006 – The Federal Service for Intellectual Property, Patents and Trademarks (Rospatent) has awarded a patent “Method for correction of drift-distorted surface images obtained with scanning probe microscope” to the Institute of Physical Problems, inventor R. V. Lapshin
• January 2006 – A group of Japanese scientists M. Aketagawa, K. Takada, P. Rerkkumsup, Y. Togawa, and H. Honda reported precisely controllable STM tip movement by carbon atoms on highly oriented pyrolytic graphite surface along a crystalline axis (Meas. Sci. Technol., vol. 17, pp. 513-518). Much better experimental results were obtained by R. V. Lapshin 8 years ago! Lapshin was probably the first who successfully demonstrated a practical feasibility of the atom-by-atom tracking on a regular crystal surface along a crystallographic direction. By unknown reasons the important and interesting work of the Japanese researchers does not mentioned any of Lapshin's results published elsewhere in 1998, 1999, 2000, 2002, and 2004. The other relevant reference on paper of B. S. Swartzentruber (Phys. Rev. Lett., vol. 76, pp. 459-462) published in 1996 was also omitted in their report.

Archive – 2005, 2004, 2003