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╟── Research
║ ├─ Miniature “walker” type XY‑nanopositioner
║ ├─ Structure characterization of carbon nanotubes
║ ├─ Method and test structure for AFM‑measurements of nanometer thick water films
║ ├─ Polymer surface treatment in vacuum ultraviolet
║ ├─ Drift‑insensitive distributed calibration of probe microscope scanner
║ ├─ Drift elimination based on counter‑scanned images
║ ├─ Feature‑oriented scanning
║ └─ Feature‑oriented positioning
║
╟── Publications
║ ├─ Selected publications
║ │ ├ Automatic drift elimination in probe microscope images based on techniques of counter‑scanning and topography feature recognition
║ │ ├ Feature‑oriented scanning methodology for probe microscopy and nanotechnology
║ │ ├ Object‑oriented scanning for probe microscopy and nanotechnology
║ │ ├ Digital data readback for a probe storage device
║ │ ├ Automatic lateral calibration of tunneling microscope scanners
║ │ ├ Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope
║ │ └ Fast‑acting piezoactuator and digital feedback loop for scanning tunneling microscopes
║ ├─ Complete list of papers
║ └─ Complete list of reports
║
╟── Patents
║ ├─ Method for correction of drift‑distorted surface images obtained with scanning probe microscope
║ ├─ Method for automatic distributed calibration of probe microscope scanner
║ ├─ Procedure of movement of sonde of scanning microscope‑nanolithograph in field of coarse X‑Y positioner
║ ├─ Method for measuring surface relief by means of scanning probe type microscope
║ └─ Method for reading digital information in probe memory device
║
╟── Gallery
║ ├─ Polymethylmethacrylate film nanostructured in oxygen plasma
║ ├─ Carbon clusters plasma‑deposited on polyurethane
║ ├─ Carbon clusters plasma‑deposited on low‑density polyethylene substrate
║ ├─ Hollows in the aluminum substrate formed after removing porous alumina
║ ├─ Mechanical indentation of silicon probe in copper thin film
║ ├─ Mechanical indentation of silicon probe in aluminum foil
║ ├─ Nanostructured surface of electrochemically polished aluminum foil
║ ├─ Surface microstructuring at low vacuum condensation of aluminum vapours
║ ├─ Electrochemically etched ordered pores in alumina
║ ├─ Through ordered pores in alumina membrane
║ ├─ Disordered array of pores in alumina membrane
║ ├─ Quasiordered array of opal balls on silicon substrate
║ ├─ Ordered array of opal balls on silicon substrate
║ ├─ Gold‑covered ordered array of opal balls
║ ├─ Ordered areas of nonspherical opal particles
║ ├─ Carbon clusters plasma‑deposited on electron resist substrate
║ └─ Silicon surface submicron structuring induced by oxygen adsorption
║
╟── Downloads
║ ├─ Recognizer
║ ├─ Stylizer
║ ├─ Calibrator
║ ├─ Corrector
║ ├─ Batch file
║ ├─ Chn to ASCII Converter
║ └─ SM2 to ASCII Converter
║
╙── Biography
├─ Professional experience
├─ Achievements in science
├─ Research grants
├─ Membership
├─ Services
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├─ Education
└─ Miscellanea
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· Copyright © 2003-2007 · R. V. Lapshin ·
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