Archive
2008
2007
- December 2007 – “As one of the most important contributors to his profession”, Dr.
R. V. Lapshin has been selected for inclusion in Who's
Who in Science and Engineering®, 10th Edition, 2008-2009 – an honor that is achieved by only a select few. This biographical directory is issued by Marquis Who's Who®, New Providence, USA, the leading biographical reference publisher
- November 2007 – The Federal
Service for Intellectual Property, Patents and Trademarks (Rospatent) has decided to issue a patent “Method of correction of surface images obtained using scanning probe microscope and distorted with drift” to R. V. Lapshin, the author of invention
- November 2007 – The material “Method for automatic correction of drift-distorted SPM-images” reported by R. V. Lapshin at the Symposium “Nanophysics and Nanoelectronics”, Nizhni Novgorod, 2005 has been published in the Journal of Surface. This paper presents preliminary results on application of counter-scanned images for drift correction in scanning probe microscopy. Full description of the method may be found in paper “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”
- April 2007 – “As a noted and eminent professional in science”, Dr. R. V. Lapshin has been selected for inclusion in the Leading Scientists of the World, 2007 – a renowned international biographical reference book administrated by the International Biographical Centre, Cambridge, UK
- March 2007 – The article “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, by
R. V. Lapshin has been published in journal of Measurement Science and Technology. The article suggests a simple but effective method intended for correction of drift-distorted SPM scans. The obtained results should be interesting for those who operate or develop scanning probe instruments such as STM, AFM, SPM, MFM, SNOM or SEM. It is important that the method may be easily embedded in feature-oriented scanning permitting to notably improve its precision and performance
- March 2007 – “As a noted and eminent professional in engineering”, Dr. R. V. Lapshin has been selected for inclusion in the Leading Engineers of the World, 2007 – a renowned international biographical reference book administrated by the International Biographical Centre, Cambridge, UK
- February 2007 – The encyclopedia entries in English “Feature-oriented scanning”, “Feature-oriented positioning”, and “Counter-scanning” are inserted in Wikipedia, the Free Encyclopedia
- February 2007 – “Drift-free Scanning Probe Microscopy (SPM) Measurements at Room Temperature”, Research News, the National Nanotechnology Initiative (NNI): When measuring topography and surface properties with probe instruments in nanometer scale at room temperature, drift of the probe relative to the sample surface is an important issue of the measurements precision. A simple but effective method based on counter-scanning was suggested in the Solid Nanotechnology Laboratory, the Institute of Physical Problems, Moscow, Russian Federation to correct this drift influence. The results are relevant for those operating or developing scanning probe instruments. Read more
- January 2007 – The encyclopedia entries in Russian “Feature-oriented scanning”, “Feature-oriented positioning”, and “Counter-scanning” are inserted in Wikipedia, the Free Encyclopedia
2006
- November 2006 – The article “Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma”, by A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko has been published in the Journal of Surface. The article describes a new technology permitting a low-temperature polymer modification in carbon plasma. This work is aimed to fabricate a biocompatible coating of alternating hydrophobic-hydrophilic nanostructures
- November 2006 – The article “Automatic distributed calibration of probe microscope scanner”, by R. V. Lapshin has been published in the Journal of Surface. This article is dedicated to a method eliminating all systematic measurement errors of the scanner such as static nonlinearities, nonorthogonality, and parasitic crosstalk couplings at once. The proposed method is based on the feature-oriented scanning-positioning approach
- September 2006 – The Federal
Service for Intellectual Property, Patents and Trademarks (Rospatent) has decided to issue a patent “Method of automatic distributed calibration of probe microscope scanner” to R. V. Lapshin, the author of invention
- September 2006
– “As one of the most accomplished people in his professional field”, Dr.
R. V. Lapshin was included in Who's
Who in Science and Engineering®, 9th Edition, 2006-2007 – an exclusive international
directory of biographical data published by the Marquis
Who's Who LLC, New Providence, USA
- July 2006 – Application for patent “Method of correction of surface images obtained using scanning probe microscope and distorted with drift”, inventor R. V. Lapshin has been resubmitted to the Federal
Service for Intellectual Property, Patents and Trademarks (Rospatent) after
reformulation and correction of detected errors
- April 2006 – Interview “60
seconds with …” conducted by Laura Shaw, the Institute
of Physics, Bristol, UK with Dr. R. V. Lapshin, author of the paper “Feature-oriented
scanning methodology for probe microscopy and nanotechnology” which has been
deemed by peer review to be of top quality
- January 2006 – The Federal Service for Intellectual Property, Patents and Trademarks (Rospatent) has awarded a patent “Method of correction of surface images obtained using scanning probe microscope and distorted with drift” to the Institute
of Physical Problems, inventor R. V. Lapshin
- January 2006 – A group of Japanese
scientists M. Aketagawa, K. Takada, P. Rerkkumsup, Y. Togawa, and
H. Honda reported precisely controllable STM tip movement by carbon atoms on highly
oriented pyrolytic graphite surface along a crystalline axis (Meas.
Sci. Technol., vol. 17, pp. 513-518). Much better experimental results were
obtained by R. V. Lapshin 8 years ago! Lapshin was probably the first who
successfully demonstrated a practical feasibility of the atom-by-atom tracking on a
regular crystal surface along a crystallographic direction. By unknown reasons the
important and interesting work of the Japanese researchers does not mentioned any of
Lapshin's results published elsewhere in 1998, 1999, 2000, 2002, and 2004. The other relevant reference on paper of B. S. Swartzentruber (Phys. Rev. Lett., vol. 76, pp. 459-462) published in 1996 was also omitted in their report
2005
2004
- December 2004 – Application for patent “Method of correction of surface images obtained using scanning probe microscope and distorted with drift”, inventor R. V. Lapshin has been submitted to the Federal Service for Intellectual Property, Patents and Trademarks (Rospatent)
- September 2004 – The article “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, by R. V. Lapshin has been published in Nanotechnology journal. The article describes a new approach significantly improving precision and resolution of SPM measurements and paves the way for practical implementation of complex unmanned nanofabrication processes
- April 2004 – The Russian Foundation for Basic Research (RFBR) has decided to extend on one more year the investigation of physical-chemical peculiarities of radiation-stimulated modification of surfaces of crystalline and noncrystalline solids aimed to form specific properties of the solids. The study is conducted by Dr. A. P. Alekhin (the leader of the project), Dr. R. V. Lapshin, and Mr. A. G. Kirilenko, a research group from the Institute of Physical Problems
- February 2004
– The article “Surface morphology of thin carbon films deposited from plasma on polyethylene with low density”, by A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin has been published in the Journal of Surface. The article reports low-density polyethylene modification in carbon plasma applicable as a biocompatible coating of artificial organs
- January 2004 – The Moscow Committee on Science and Technologies on behalf of the Moscow City Government has prolong on one more year the grant “Development of low-temperature synchrotron radiation stimulated processes forming surface structures applicable to medicine”. A team of scientists from the Institute of Physical Problems, Dr. A. P. Alekhin (the leader), Dr. R. V. Lapshin, and Mr. A. G. Kirilenko will continue their investigation of this task
2003
- September 2003 – The article “Investigation of nanostructured carbon coating on polyethylene as a substrate”, by A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev has been published in the Journal of Applied Chemistry. The article devoted to investigations of carbon films on low-density polyethylene by scanning electron microscopy, scanning atomic-force microscopy, IR, Raman, visible and UV spectroscopies
- May 2003 – The report “AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface”, by S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin have been presented at the International Conference “Nanomeeting-2003” held in Minsk, Belarus. This report dedicated to formation of highly ordered nanopores in aluminum substrate
- January 2003 – The Moscow City Government through its representative the Moscow Committee on Science and Technologies has approved grant “Development of low-temperature synchrotron radiation stimulated processes forming surface structures applicable to medicine” aimed on city development. A team of researches from the Institute of Physical Problems, Dr. A. P. Alekhin (the head of the project), Dr. R. V. Lapshin, and Mr. A. G. Kirilenko will investigate the formulated problems
leave Archive
November 2008 – “What is matter?” A school textbook titled “Science & Technology Perspectives 7” published by the Nelson Education Ltd. explains this by using a simple thing – aluminum foil being examined at different scales. The smallest scale represents what the Russian scientists Dr. R. V. Lapshin, the Institute of Physical Problems and Dr. S. A. Gavrilov, the Moscow Institute of Electronic Technology observed with a scanning probe microscope. The book will be available to Grade 7 students throughout the Canadian provinces of Ontario and Manitoba