I am searching for partner(s) interested in further development and/or commercialization of the feature-oriented scanning (FOS) methodology that is applicable for high-precision, high-resolution scanning probe microscopy, automatic surface characterization, nanometrology, and unmanned bottom-up nanofabrication both in single- and multiprobe configurations. Feel free to contact me if you have any questions, comments or research/business proposals related to such collaboration
I have some patentable thoughts and know-hows on construction and control methods of a miniature robot-nanopositioner of “walker” type (noninertial) with unique characteristics. The invented robot-nanopositioner is intended for high-precision positioning, surface characterization, nanometrology, bottom-up nanofabrication, etc on nonrestricted area. Contact me if you have an interest in joint development, testing, and following production of such apparatus
I am conducting custom STM & AFM measurements. Available instruments (NT-MDT Co.): SPM Solver™ P4 (ambient), SPM Smena™ HV, SPM Solver™ UHV. Besides, measurements on optical profilometer Wyko NT9300 (interference microscope) and IR-microscope FLIR SC5000 are also possible. Safety of samples, confidentiality of customer and measurement data are guaranteed. Contact me to discuss problems related to measurements of your samples
Very accurate calibration of probe microscope scanners, XY stages, manipulators, etc. in nanometer and subnanometer ranges by natural standards – crystalline lattices is now possible. Analysis and certification of operation of these positioners based on precise measurements of thermal drifts, creeps, nonlinearities, and spurious couplings are possible as well. Feel free to contact me if you need to resolve your calibration problems
If you are a publisher searching for nanoscience or nanotechnology related illustrations, take a look at the nanorealm snapshots – real high magnification surface scans, collages, and artworks presented in the Gallery section. Illustrations intended for educational programs or science popularization purposes are free of charge. Just ask the author for a formal written permission to reproduce those materials
Take a look at the Patents section where several high-end measurement techniques applicable to scanning probe microscopy and bottom-up nanotechnology are presented (all the patents were recognized by the Rospatent, the Russian patent office as perspective and were included in the special database Perspective Inventions). Your requests for licensing are welcome. Click here to establish a business contact
To find web materials relevant to my activities, click on the search icons given below. The searches are executed separately on English and Russian sites
Dr. R. V. Lapshin, Staff Scientist
Solid Nanotechnology Laboratory, Nanoelectronics Department Institute of Physical Problems named after F. V. Lukin
State Scientific Center of Russian Federation
passage 4806, building 6, Zelenograd
Moscow, 124460
Russian Federation
tel (lab): +7 (499) 736-9379, 736-9324 tel (office): +7 (499) 731-9843 fax (office): +7 (499) 731-5592
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tel (lab): +7 (499) 736-9379, 736-9324
fax (office): +7 (499) 731-5592
pri email: rlapshin@yahoo.com
web (office): www.niifp.ru/
