Home - Lapshin's Personal Page on SPM & Nanotechnology

WELCOME TO PERSONAL PAGE OF

Rostislav V. LAPSHIN, Ph. D.
a researcher-developer-microscopist

Professional interests:
· scanning tunneling microscopy · atomic-force microscopy ·
· scanning probe microscopy · high capacity probe storage ·
· critical dimension metrology · automatic surface characterization ·
· nanolithography · nanomanipulation · nanoassembling ·
· nanofabrication · molecular manufacturing · nanotechnology ·

· announcements · news & events · search me on web ·
· related links · contact info · feedback · R&D projects ·
· selected papers · conference reports · key patents ·
· SPM scans · free software · biographical data · page map ·

Announcements:

Dear visitor, I am searching for partner(s) interested in further development and/or commercialization of the feature-oriented scanning (FOS) methodology applicable for both scanning probe microscopy and bottom-up nanofabrication. Contact me if you have any questions, comments or research/business proposals related to such collaboration
Dear visitor, I have some patentable thoughts and know-how on construction and control methods of a miniature XY nanopositioner of “walker” type. The invented positioner is free of its predecessor's drawbacks such as: x, y, z position instabilities, undesired rotation in the sample plane and sticking, all due to microroughnesses and pollutions in the contact area of electrostatic supports. Another advantage of the suggested positioner consists in its full compatibility with the feature-oriented scanning (FOS) approach. Both ambient and UHV arrangements are possible. Due to a low weight and small dimensions, the proposed nanopositioner may be incorporated in many instruments like SPM, SEM, FIB, Auger, etc. This nanopositioner is mounted instead of a sample and the sample itself is mounted on top of the nanopositioner. Contact me if you have a concern in joint development, testing and following production of such nanopositioner