Group of near-field optics,
laboratory "photo-physics",
State Research Center
"S.I.Vavilov State Optical Institute".




Members of group
Main directions of group`s work
Working instrument
Publications list
Contact person
Postal address


Members of group:
 
Mikhail N.Libenson libenson@beam.ifmo.ru Doctor of Science, Soros Professor, Head of Laboratory, Professor of Technical University PIFMO, Vice-Chairman of the Social Scientific Council under Education & Science Committee of the State Duma.
Larisa Amosova  
Vitali Gruzdev  
Natalja Guzovskaja  
Yuri Guzovski  
Ivanna Gus’kova  
Igor Didenko  
Gleb Zhdanov  
George Martsinovsky  
Sergey Murashov  

Main directoions of group`s work:
Investigation of interaction of laser radiation with the system near-field probe and surface;
Increasing of efficiency of near-field probes;
Application of near-field optics in high-power optics.

Working instrument:
Setup for investigation of optical near-field action on surfaces. The setup is based on STM manufactured at St.-Petersburg State University.
Setup for investigation of optical near-field action on surfaces. The setup is based on STM manufactured at St.-Petersburg State University.

Publications list
V.E.Gruzdev, M.N.Libenson, G.A.Martsinovsky, M.A.Paesler, M.J.Soileau, B.I.Yakobson, "Near-field optical microscopy: application to investigation of surface laser-induced damage of transparent optical materials", Laser-Induced Damage in Optical Materials, Proc. SPIE, 1998, v.3244, pp.668-677 ;

The character of surface optical breakdown is connected with intrinsic and induced defects. The methods and instruments of scanning near-field optical microscopy (SNOM) were applied for its investigation. The methods of SNOM allowed receiving full information about local optical properties and microstructure of the surface, and distribution of the light field over the surface. Evolution of the surface defects under powerful fields can be studied with SNOM as well. The basic principles of application of SNOM to investigation of surface optical breakdown of transparent dielectrics were described.