Group of near-field optics, laboratory
"photo-physics", State Research Center "S.I.Vavilov State Optical Institute".
Members of
group Main directions of group`s work Working instrument Publications list Contact
person Postal
address
Members of group:
| Mikhail
N.Libenson libenson@beam.ifmo.ru |
Doctor of Science, Soros Professor, Head of Laboratory, Professor of
Technical University PIFMO, Vice-Chairman of the Social Scientific Council under
Education & Science Committee of the State Duma. |
| Larisa
Amosova |
|
| Vitali
Gruzdev |
|
| Natalja
Guzovskaja |
|
| Yuri
Guzovski |
|
| Ivanna
Gus’kova |
|
| Igor
Didenko |
|
| Gleb
Zhdanov |
|
| George
Martsinovsky |
|
| Sergey
Murashov |
|
Main directoions of group`s work: Investigation of interaction of laser radiation with the system
near-field probe and surface; Increasing of efficiency of near-field
probes; Application of near-field optics in high-power optics.
Working instrument: Setup
for investigation of optical near-field action on surfaces. The setup is based
on STM manufactured at St.-Petersburg State University. Setup
for investigation of optical near-field action on surfaces. The setup is based
on STM manufactured at St.-Petersburg State University.
Publications list V.E.Gruzdev, M.N.Libenson, G.A.Martsinovsky, M.A.Paesler, M.J.Soileau,
B.I.Yakobson, "Near-field optical microscopy: application to investigation of
surface laser-induced damage of transparent optical materials", Laser-Induced
Damage in Optical Materials, Proc. SPIE, 1998, v.3244, pp.668-677
;
The
character of surface optical breakdown is connected with intrinsic and induced
defects. The methods and instruments of scanning near-field optical microscopy
(SNOM) were applied for its investigation. The methods of SNOM allowed receiving
full information about local optical properties and microstructure of the
surface, and distribution of the light field over the surface. Evolution of the
surface defects under powerful fields can be studied with SNOM as well. The
basic principles of application of SNOM to investigation of surface optical
breakdown of transparent dielectrics were described. |