|
 about
activity
cooperation
SPM museum
conferences
library
scan-gallery
This week scan
|
- Sections
-
- Hydrophobic-hydrophilic
nanostructure synthesis on polymer surfaces in low-temperature
carbon plasma. A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin,
R. V. Lapshin, S. N. Mazurenko, Surface. Roentgen, synchrotron
and neutron studies, no. 11, pp. 8-11, 2006.
- Surface morphology of thin carbon films deposited from plasma
on polyethylene with low density. A. P. Alekhin, A. G. Kirilenko,
R. V. Lapshin, Surface. Roentgen, synchrotron and neutron studies,
no. 2, pp. 3-9, 2004.
- Nanostructured carbon coatings on polyethylene films. A. P.
Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A.
Sigarev, Russian Journal of Applied Chemistry, vol. 76, no. 9,
pp. 1497-1501, 2003.
- AFM investigation of highly ordered nanorelief formation by
anodic treatment of aluminum surface. S. A. Gavrilov, V. M. Roschin,
A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin,
E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin,
Physics, Chemistry and Application of Nanostructures: Reviews
and Short Notes to Nanomeeting 2003, Editors: V. E. Borisenko,
S. V. Gaponenko, V. S. Gurin, World Scientific Publishing Ltd.,
London, UK, pp. 500-502, 2003.
- Automatic drift elimination in probe microscope images based
on techniques of counter-scanning and topography feature recognition.
R. V. Lapshin, Measurement Science and Technology, vol. 18, iss.
3, pp. 907-927, 2007.
- Automatic distributed calibration of probe microscope scanner.
R. V. Lapshin, Surface. Roentgen, synchrotron and neutron studies,
no. 11, pp. 69-73, 2006.
- Method for automatic correction of drift-distorted SPM-images.
R. V. Lapshin, Symposium "Nanophysics and Nanoelectronics",
Nizhni Novgorod, Russian Federation, vol. 1, pp. 159-160, 2005.
- Automatic distributed calibration of probe microscope scanner.
R. V. Lapshin, Symposium "Nanophysics and Nanoelectronics",
Nizhni Novgorod, Russian Federation, vol. 1, pp. 161-162, 2005.
- Procedure
of movement of sonde of scanning microscope-nanolithograph in
field of coarse X-Y positioner. R. V. Lapshin, Patent of Russian
Federation, no. 2,181,212, September 7, 1999.
- Method
for measuring surface relief by means of scanning probe type microscope.
R. V. Lapshin, Patent of Russian Federation, no. 2,175,761, June
8, 1999.
- Method
for reading digital information in probe memory device. R.
V. Lapshin, Patent of Russian Federation, no. 2,181,218, November
2, 1998.
- Feature-oriented
scanning methodology for probe microscopy and nanotechnology.
R. V. Lapshin, Nanotechnology, vol. 15, no. 9, pp. 1135-1151,
2004.
- Object-oriented
scanning for probe microscopy and nanotechnology. R. V. Lapshin,
Ph. D. thesis, the Institute of Physical Problems, Moscow, 2002.
- Automatic
lateral calibration of tunneling microscope scanners. R. V.
Lapshin, Review of Scientific Instruments, vol. 69, no. 9, pp.
3268-3276, 1998.
- Analytical
model for the approximation of hysteresis loop and its application
to the scanning tunneling microscope. R. V. Lapshin, Review
of Scientific Instruments, vol. 66, no. 9, pp. 4718-4730, 1995.
- Fast-acting
piezoactuator and digital feedback loop for scanning tunneling
microscopes. R. V. Lapshin, O. V. Obyedkov, Review of Scientific
Instruments, vol. 64, no. 10, pp. 2883-2887, 1993.
- Surface Forces and
Adhesion (pdf). N.A. Burnham and A.J. Kulik
- Two-Dimensional
Ferroelectrics (Review). L. M. Blinov, V. M. Fridkin, S. P.
Palto, A. V. Bune, P. A. Dowben, S. Ducharme.
- Electrical-conductivity
SFM study of an ultrafiltration membrane. P-J Gallo, A J Kulik,
N A Burnham, F Oulevey and G Gremaud. Nanotechnology, 8, (1997),
P. 10–13. (PDF 366 592 bytes). (Abstr.)
- Theoretical and
experimental evidence for "true" atomic resolution under
non-vacuum conditions. I. Yu. Sokolov, G. S. Henderson, F.
J. Wicks. Journ.Appl.Phys. V.86, N 10, P. 5537-5540 (1999). (Abstr.)
- Imitation
of non-contact mode while scanning in the presence of an electric
double layer? I. Yu. Sokolov, G. S. Henderson, F. J. Wicks.
Journ.Appl.Phys. Appl. Surf. Science. V. 140, (1999), P. 422-427.
(Abstr.)
- AFM
characterization of domain structure of ferroelectric TGS crystals
on a nanoscale.A.L. Tolstikhina, N.V. Belugina and S.A. Shikin.
Ultramicroscopy, Volume 82, Issue 1-4, 2000, pp. 149-152 (PDF
480113 bytes)
- Forming
and electric properties of the planar 2D-nonodimension structures.
U.A. Adamov, N.V. Korneev, V.G. Mocerov, V.K. Nevolin.
- Micromechanics
for Scanning Probe Microscopy and nanotechnology. V.A. Bykov.
- Elastic
stress and composition of the autogamous nanoislets GeSi on Si
. N.V. Vostokov, S.A. Gusev, I.V. Dolgov, U.N. Drozdov, Z.F.
Kracilnik, D.N. Lobanov, L.D. Moldavskay, A.V. Novikov, V.V. Postnikov,
D.O. Filatov.
- Constructive
Nanolithography: Site-Defined Silver Self-Assembly on Nanoelectrochemically
Patterned Monolayer Templates. R. Maoz, E. Frydman, S. R.
Cohen, J. Sagiv. Advanced Materials, Volume 12, Issue 6, 2000,
pp. 424-429.(PDF 1.24 Mbytes)
- WS2 nanotubes as tips in scanning probe microscopy.
(PDF 658331 bytes) A. Rothschild, S.R. Cohen, R. Tenne.Applied
Physics Letters, Volume 75, Number 25, 20 December 1999.
- Cross-sectional
atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes.
A.V. Ankudinov, A.N. Titkov, T.V. Shubina, S.V. Ivanov, P.S. Kop'ev,
H.-J. Lugauer, G. Reuscher, M. Keim, A. Waag, G. Landwehr. Appl.Phys.Lett.
75(17), p.2626 (1999)(PDF 392594 bytes)
- A New
Lamellar Morphology of a Hybrid Amorphous/Liquid Crystalline Block
Copolymer Film. D. Sentenac, A. L. Demirel, J. Lub, and W.
H. de Jeu*. Macromolecules 1999, 32(10), 3235-3240. (PDF 1.76
Mbytes)
- Nanorelief
of the oxidated surface of the chip grating rotational heterlayers
Ga0.7Al0.3As and GaAs.A.V. Ankudinov, V.P. Evtihiev, V.E.
Tokranov, V.P. Ulin, A.N. Titkov.
- System of
parameters for roughness and microrelief of the surface materials
analysisin the scanning probe microscopy. P.A. Arutunov, A.L.
Tolstikhina, V.N.Demidov.
- Growth
mode study of ultrathin HTSC YBCO films on YBaCuNbO buffer.
I. Grekhov, L. Delimova, I. Liniichuk, A. Lyublinsky, I. Veselovsky,
A. Titkov, M. Dunaevsky, V. Sakharov. Physica C 324 1999 39–46.(PDF
2.37 Mbytes)
- Atomic
force microscopy in the problems of the of the designing devices
for micro- and nanoelectronics. Part I. P.A. Arutunov, A.L.
Tolstikhina.
- Atomic
force microscopy in the problems of the of the designing devices
for micro- and nanoelectronics. P.A. Arutunov, A.L. Tolstikhina.
Part II. Microelectronics, 1999, Volume 29, Issue 1, pp. 13-22.
- Reduction
of the size of the implanted silver nanoparticles in float glass
during excimer laser annealing. A.L. Stepanov, D.E. Hole,
A.A. Bukharaev, P.D. Townsend and N.I. Nurgazizov. Applied Surface
Science (136) 4 (1998) pp. 298-305. (PDF 1.17 Mbytes)
- Conductive
SPM probes of base Ti or W refractory compounds. Nanotechnology.
V. Shevyakov, S. Lemeshko, V. Roschin. 9 (1998) 352-355.(PDF 799766
bytes)
- Test
structure for SPM tip shape deconvolution. V. Bykov, A. Gologanov,
V. Shevyakov. Applied Physics A Materials Science & Processing,
Abstract Volume 66 Issue 5 (1998) pp 499-502
(PDF 310634 bytes)
- MBE growth and
characterization of ferromagnetic MnAs layers on CaF2:Si(111).
A.G. Banshchikov, M.V. Baidakova, B.P. Zakharchenya, K. Saito,
N.S. Sokolov, S.M. Suturin, M. Tanaka. Nanostractures: Physics
and Technology 97, International and Technology St.Petersburg
Russia 23-27 June 1997.
(PDF 500202 bytes)
- Surface diagnostics
using Scanning Probe Mycroscopy (review). A.A. Bukharaev,
D.V. Ovchinnikov, A.A. Bukharaeva. Factory laboratory, Recearch
of the structure and of the characteristics, Physical methods
of the research and of the control, UDK 620.187:539.25, pp. 10-27
- Langmuir-Blodgett
films and nanotechnology. V.A. Bykov. Biosensor & Bioelectronics
Vol. 11, No. 9, pp. 923-932, 1996.(PDF 1.68 Mbytes)
- Investigation
of Langmuir Films of Fullerene Derivative Resulting by Addition
of C60 to Tetracyanoethylene Oxide. V.R. Novak, S.L. Vorob'eva,
and I.V. Myagkov. Mol .Mat., Vol. 7, pp. 175-178, 1996. (PDF 286073
bytes)
- Characterization
of GaAs/GaAlAs MOCVD Superlatice by STM/AFM Technique. Russian
Academy of Siences. V.A. Fedirko, V.A. Bykov, M.D. Eremtchenko,
V.I. Shashkin and V.M. Daniltzev. Abstracts of Invited Lectures
and Contributed Papers, St Petersburg, Russia, 24-28 June 1996,
pp.. 381-384.(PDF 235385 bytes)
- Microrelief
research of segnetoelectrics TGS and Rb2ZnCl2 crystals surface
of using Atomic Force Microscope method. N.V. Belugina, A.L.
Tolstihina. Crystalography, 1996, vol 41, N6, pp. 1072-1076.
- Scanning
tunneling microscopy investigation offtillerene monolayers.V.A.
Fedirko, V.A. Bykov and M.D. Eremchenko. Fresenius Journ. of Analytical
Chemistry, 1996, v. 355, N 5-6, p. 707-710. (PDF 399789 bytes)
- Spectroscopic
study of nickel(II) hydroxide surface modifications induced by
a small iron(III) addition. Alexander A. Kamnev, Alexander
A. Smekhnov. Fresenius Journ. of Analytical Chemistry, 1996, v.
355, N 5-6, p. 710-712.
(PDF 385763 bytes)
- Creation
and structural investigation of the thin films of the lysozyme.
Thesis of the I conference by highly organized compounds,
June 1996, pp. 237-238. R.L. Kaushina, N.D. Stepina, V.V. Beliaev,
U.I. Hurgin, A.L. Tolstikhina, V.V. Klechkovskaia.
- Mono- and
multimolecular layers from mixed an esters of the cellulose obtained
using the triftoracetic acid. A.K. Hripunov, U.G. Baklagina,
V.M. Denisov, A.I. Volkov, V.K. Lavrentiev, N.V. Cvetkov, A.V.
Sidorovich, N.D. Stepina, V.V. Klechkovskaia, L.G. Ianusova, A.L.
Tolstikhina, V.V. Beliaev, L.A. Feygin.Thesis of the I conference
by highly organized compounds, June 1996, pp. 332-334.
- Structure
features of the amorphous films of the oxide titanium depending
on in accordance with conditions. A.L. Tolstikhina, K.L. Sorokina.
Crystallography, 1996, Volume 41, Issue 2, pp.339-347.
- Scanning
tunneling and atomic force microscopy of surface modified by ion
and laser beams. A.A. Bukharaev. Physics-Uspekhi 1996, v.39.
N2, P.193-196.(PDF 1021871 bytes)
- Atomic
force microscopy of laser induced sub-micrometer periodic structures
on implanted fused silica and silicon. A.A. Bukharaev, V.M.
Janduganov, E.A. Samarsky, N.V. Berdunov. Applied Surface Science
103 (1996) 49-54.(PDF 1.02 Mbytes)
- Heat
stable Langmuir-Blodgett film of Glutathione-S-Transferase.
F. Antolini, S. Paddeu, C. Nicolini. Langmuir 1995, 11, 2719-2725.(PDF
1.39 Mbytes)
- High-sensitivity
biosensor based on LB technology and on nanogravimetry. C.
Nicolini, M. Adami, T. Dubrovsky, V. Erokhin, P. Facci, P. Paschkevitsch,
M. Sartore. Sensors and Actuators B 24-25 (1995) 121-128.(PDF
1022812 bytes)
- Thermal
stability of bipolar lipid Langmuir Blodgett films by X-ray diffraction.
S. Dante, M. De Rosa, E. Maccioni, A. Morana, C. Nicolini, F.
Rustichelli, V.I. Troitsky, B. Yang. Mol. Cryst. liq. Cryst. 1995,
Vol. 262, pp. 191-207.(PDF 1.28 Mbytes)
- Deposition
of uniform fullerene films by LB technique. T.S. Berzina,
V.I. Troitsky, O.Ya. Neilands, I.V. Submale, C. Nicolini. Thin
Solid Films, 256 (1995) 186-191.(PDF 1.07 Mbytes)
- Observation
of room temperature mono-electron phenomena on nanometre-sized
CdS partices. V. Erokhin, P. Facci, S. Carrar, C. Nicolini.
J. Phys. D: Apll. Phys. 28 (1995) 2534-2538. Printed in the UK
N12.(PDF 985422 bytes)
- Immunological
activity of IgG Langmuir films oriented by protein A sublayer.
T. Dubrovsky, A. Tronin, S. Dubrovskaya, S. Vakula, C. Nicolini.
Sensors and Actuators B 23 (1995) 1-7.(PDF 1.27 Mbytes)
- Conducting
Langmuir-Blodgett films of heptadecylcarboxymethyl-BEDT-TTF.
V.I. Troitsky, T.S. Berzina, Ya.Ya. Katsen, O.Ya. Neilands, C.Nicolini.
Synthetic Metals 74 (1995) 1-6.(PDF 1.10 Mbytes)
- X-ray diffraction
structural analysis of Langmuir-Blodgett films using a pattern
recognition approach. E. Maccioni, P. Mariani, F. Rustichelli,
H. Delacroix, V.Troitsky, A. Riccio, A. Gambacorta, M.De Rosa.
Thin Solid Films, 265 (1995) 74-83.(PDF 1.67 Mbytes)
- Langmuir-Blodgett
films of bipolar lipids from thermophilic archaea. T.S. Berzina,
V.I. Troitsky, S. Vakula, A. Riccio, A. Morana, M. De Rosa, S.
Dante, E. Maccioni, F. Rustichelli, P. Accossato, C. Nicolini.
Materials Science and Engineering: C 3 (1995) 13-21.(PDF 1.80
Mbytes)
- Deposition
of Langmuir-Blodgett alternating bilayers of valinomycin and chemically
modified bipolar lipid from archaea. T.S. Berzina, V.I. Troitsky,
S. Vakula, A. Riccio, A. Morana, M. De Rosa, L. Gobbi, F. Rustichelli,
V.V. Erokhin, C. Nicolini. Materials Science and Engineering:
C 3 (1995) 33-38.(PDF 1.11 Mbytes)
- Langmuir-Blodgett
multilayers of native and synthetic glycerol-dialkyl-glycerol
tetraether derivatives from archaea. T.S. Berzina, V.I. Troitsky,
S. Vakula, A. Riccio, A. Gambacorta, M.De Rosa, L.Gobbi, F. Rustichelli,
V.V. Erokhin, C. Nicolini. Materials Science and Engineering:
C 3 (1995) 23-31.(PDF 1.73 Mbytes)
- Scanning
probe microscopy of diffraction gratings induced by lazer radiation.
A.A. Bukharaev, V.S.Lobkov, V.M. Janduganov, E.A. Samarsky, N.V.
Berdunov. Optics and Spectroscopy. 1995, Vol.79, N3, pp. 417-425.
- Formation
of Ultrathin Semiconductor Films by CdS Nanostructure Aggregation.
P. Facci, V. Erokhin, A. Tronin, C. Nicolini. J. Phys. Chem. 1994,
98, 13323-13327.(PDF 1.08 Mbytes)
- Scanning
tunnelling microscopy of a monolayer of reaction centres.
P. Facci, V. Erokhin, C. Nicolini. Thin Solid Films, 243 (1994)
403-406.(PDF 815599 bytes)
- Surface
potential studies of monolayers of surfactant donor and acceptor
molecules.F. Rustichelli, S. Dante, P. Mariani, I.V. Myagkov,
V.I. Troitsky. Thin Solid Films, 242 (1994) 267-272. (PDF 866154
bytes)
- Reversed
micellar approach as a new tool for the formation and structural
studies of protein Langmuir-Blodgett films. V. Erokhin, S.
Vakula, C. Nicoloni. Thin Solid Films, 238 (1994) 88-94.(PDF 914727
bytes)
- Langmuir-Blodgett
films of immunoglobulines IgG. Ellipsometric study of the deposition
process and of immunological activity. A. Tronin, T. Dubrovsky,
C.De Nitti, A. Gussoni, V. Erokhin, C. Nicoloni. Thin Solid Films,
238 (1994) 127-132.(PDF 1008948 bytes)
- Scanning
tunneling microscopy imaging of conducting Langmuir-Blodgett films.
M. Male, E. Stussi, D.De Rossi, T.S. Berzina, V.I. Troitsky. Thin
Solid Films, 237 (1994) 225-230.(PDF 1.07 Mbytes)
- Nanogravimetric
gauge for surface density measurements and deposition analysis
of Langmuir-Blodgett films. P. Facci, V. Erokhin, C. Nicolini.
Thin Solid Films, 230 (1993) 86-89. (PDF 476977 bytes)
- Thermal
stability of protein secondary structure in Langmuir-Blodgett
films. C. Nicolini, V. Erokhin, F. Antolini, P. Catasti, P.
Facci. Biochimica et Biophysica Acta, 1158 (1993) 273-278.(PDF
869062 bytes)
- Conducting
Langmuir-Blodgett films of hexadecyl-BEDT-TF charge-transfer salts
with inorganic compounds.T.S. Berzina, V.I. Troitsky, E. Stussi,
M. Mule, D.De Rossi. Synthetic Metals, 60 (1993) 111-114. (PDF
826650 bytes)
- The
influence of structure change on electrical properties of conducting
LB films produced from HEXADECYL-TCNQ and HEPTADECYLDIMETHYL-TTF
Mixture. T.S. Berzina, S.A. Shikin, V.I. Troitsky. Makromol.
Chem., Macromol. Symp. 46, 223-227 (1991).(PDF 573960 bytes)
- The use
of SIMS, XPS, and in situ AFM to probe the acid catalysed hydrolysis
of poly(orthoesters. S.R. Leadley, K.M. Shakesheff, M.C. Davies,
J. Heller, N.M. Franson, A.J. Paul, A.M. Brown, J.F.Watts. Biomaterials,
19, (1998), 1353-1360.
- Morphological
analysis of stainless steel scale like surface morphology using
STM and AFM. V.Viginal, J.C. Roux, J.M.Olive, D. Desjardins,
V. Genton. Acta mater. Vol.46, No.1, pp.149-157,1998.
- A new approach
to pH of point of zero charge measurement: Crystal-face specificity
by scanning force microscopy (SFM). C.M. Eggleston, G. Jordan.
Geochimica et Cosmochimica Acta,Vol.62, No.11, pp.1919-1923,1998
- Imaging
the atomic-scale structure of vanadia powder surface using ambient
atomic force microscopy. C. Mathieu, S. Pe´ralta, A. DaCosta,
Y. Barbaux. Surface Science, 395, (1998), L201-L206
- Effect
of tip sharpness on the relative contributions of attractive and
repulsive forces in the phase imaging of tapping modeatomic force
microscopy. G. Bara, R.Brandscha, M.-H. Whangbo. Surface Science,
422, (1999), L192-L199.
- Miscibility
and surface crysta lmorphology of blends containing poly(vinylidene
uoride) by atomic force microscopy. Won-Ki Lee, Chang-Sik
Ha. Polymer, Vol.39, No.26, pp.7131-7134,1998.
- Study
on surface structure of amorphous polyme rblends on the basis
of latera lforce microscopy. Won-Ki Lee. Polymer, 40, (1999),
5631-5636.
- Measurement
of surface roughness by atomic force microscopyand Rutherford
backscattering spectrometry of CdSnanocrystalline films. K.K.
Nanda, S.N. Sarangi, S.N. Sahu. Applied Surface Science, 133,
1998, 293-297.
- Surface
morphology, chemical contrast, and ferroelectric domains in TGS
bulk single crystals differentiated with UHV non-contact force
microscopy. L.M. Enga, M. Bammerlina, Ch. Loppachera, M. Guggisberga,
R. Bennewitza. Applied Surface Science, 140, 1999, 253-258.
- Determination
of tip-sample interaction forces from measureddynamic force spectroscopy
curves. B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs.
Applied Surface Science, 140, 1999, 314-319.
- How
to measure energy dissipation in dynamic mode atomicforce microscopy.
B. Anczykowski, B. Gotsmann, H. Fuchs, J.P. Cleveland, V.B.
Elings. Applied Surface Science, 140, 1999, 376-382
- Ar
plasma treated and A metallised polycarbonate: a XPS, massspectroscopy
and SFM study. C. Seidela, H. Kopfa, B. Gotsmanna, T. Vietha,
H. Fuchs, K. Reihs. Applied Surface Science, 150, 1999,19-33.
- Measurement
of surface defects on thin steel wires by atomicforce microscopy.
L.M. Sanchez-Brea, J.A. Gomez-Pedrero, E.Bernabeu. Applied
Surface Science, 150, 1999, 125-130
- Microscopy
(AFM, TEM, SEM) studies of oxide scale formation on FeCrAl based
ODS alloys. A. Czyrska-Filemonowicz, K. Szot, A. Wasilkowska,
A. Gil, W.J. Quadakkers Solid State Ionics, 117, (1999), 13-20.
- An
AFM study of the properties of passive films on iron surfaces.
Jing Li, D.J. Meier. Journal of Electroanalytical Chemistry,
454, (1998), 53-58.
- AFM
studies of the nucleation and growth mechanisms of macromolecular
crystals. Yu.G. Kuznetsov, A.J. Malkin, A. McPherson. Journal
og Crystal Growth, 196, (1999), 489-502.
- Microtribological
behavior of Au(001) studied by AFM/FFM. C. Polaczyk, T. Schneider,
J. Scho¨fer, E. Santner. Surface Science, 402-404, (1998), 454-458.
- Hysteresis
generated by attractive interaction: oscillating behavior of a
vibrating tip-microlever system near a surface. R. Boisgarda,
D.Michelb, J.P. Aime´a. Surface Science, 401, (1998), 199-205
- Scanning
tunneling microscope-induced molecular motion and its effect on
the image formation. M. Bohringera,W.-D. Schneidera, R. Berndtb.
Surface Science, 408, (1998), 72-85.
- Atomic
force microscopy investigation of the surface topography and adhesion
of nickel nanoparticles to submicrospherical silica. S. Ramesh,Y.
Cohen, D. Aurbach, A.Gedanken. Chemical Physics Letters, 287,
1998, 461-467.
- The
adsorption of n-dodecane and n-pentane onto highlyoriented pyrolytic
graphite studied by atomic force microscopy. D.S. Martina,
P. Weightmana, J.T. Gauntlettb. Surface Science, 424, (1999),
187-198.
- Nanostructure
of Ge deposited on Si(100): a study by XPS peak shape analysis
and AFM A.C. Simonsen, M. Schleberger, S. Tougaard, J.L. Hansen,
A. N. Larsen. Thin Solid Films, 338, (1999), 165-171.
- AFM
characterisation of the structure of Au-colloid monolayersand
their chemical etching. A. Doron, E. Joselevich, A. Schlittner,
I. Willner. Thin Solid Films, 340, (1999), 183-188.
- Probing
the surface forces of atomic layered SrTiO3 films by atomic force
microscopy. H. Tanaka, H. Tabata, T. Kawai. Thin Solid Films,
342, (1999), 4-7.
- Lateral
force microscopy study of functionalized self-assembled monolyer.
Yin Kim, Kwang-Salk Kim, Mingyu Park, Jaein Jeong. Thin Solid
Films, 341, (1999), 91-93.
- Recovery
and amplification of plasmid DNA with atomic force microscopy
and the polymerase chain reaction. Xue-Ming Xu, Atsushi Ikai.
Analitica Chimica Acta, 361, (1998), 1-7.
- Immobilization
strategies for biological scanning probe microscopy. Peter
Wagner. FEBS Letters, 430, (1998), 112-115.
- Ultrahigh
vacuum magnetic force microscopy: domain imaging on in situ grown
Fe(100) thin films. U. Memmert, P. Leinenbach, J. Losch, U.
Hartman. Journal of Magnetism and Magnetic Materials, 190, (1998),
124-129.
- Surface
characterisation of ethilene-vinyl acetete (EVA) and ethylene-acrylic
acid (EAA) co-polymers using XPS and AFM. R. L. McEvoy, S.
Krause, P. Wu. Polymer, Vol. 39, No 21, pp. 5223-5239, 1998.
- Comparison
of atomic force microscope and Rutherford backscattering spectrometry
data nanometre size zinc islands M.F. Tabet, F.K. Urban III.
Thin Solid Films, 290-291, (1996), 312-316.
- Nanoscale
mechanical property measurements using modified atomic force microscopy.
A.V. Kulkarni, B. Bhushan. Thin Solid Films, 290-291, (1996),
206-210.
- Surfaces
coated with protein layers: a surface force and ESCA study. E.
Blomberg, P.M. Claesson, J. C. Froberg. Biomaterials, 19, (1998),
371-386.
- Characterisation
of polyacrylonitrile films grafted onto nickel by ellipsometry,
atomic force microscopy and X-ray reflectivity. C. Calberg,
M. Mertens, R. Jerome, X. Arys, A.M. Jonas, R. Legras. Thin Solid
Films, 310, (1997), 148-155.
- Scanning
force microcopy simlations of well-characterized nanostructures
on dielectric and semiconducting substrates. F. Touhari, X.
Bouji, C. Girard, M. Devel, G. Cohen-Solal. Applied Surface Science,
125, (1998), 351-359.
- An
atomic force microscopy study of the molecular organisation of
xanthan. I. Capron, S. Alexandre, G. Muller. Polymer, Vol.
39, No 23, pp. 5725-5730, 1998.
- Study
of the surface glass transition behaviour of amorphous polymer
film by sacnning-force microscopy and surface spectroscopy. I.
Capron, S. Alexandre, G. Muller. T. Kajiyama, K. Tanaka, A. Takahara.
Polymer,Vol. 39, No 19, pp. 4665-4673, 1998.
- Micro/nanoscale
friction and wear mechanisms of thin films using atomic force
and friction force microscopy. B. Bhushan, S. Sundararajan.
Acta mater., Vol. 46, No 11, pp. 3793-3804, 1998.
- Ultrasharp
diamond-coated silicon tips for scanning-probe devices. E.I.
Givargizov, A.N. Stepanova, E.S. Mashkova, V.A. Molchanov, F.
Shi, P. Hudek, I.W. Rangelow. Microelectronic Engineering, 41/42,
(1998), 499-502.
- Atomic
and chemical resolution in scanning force microscopy on ionic
surfaces. A.I. Livshits, A.L. Shluger. Applied Surface Science,
141, (1999), 274-286.
- Dependence
of the measured monolayer height on applied forces in scanning
force microscopy. M. Hartig, L.F. Chi, X.D. Liu, H. Fuchs.
Thin Solid Films, 327-329, (1998), 262-267.
- Force
titration of amino group-terminated self-assembled monolayers
of 4-aminothiophenol on gold using chemical force microscopy.
Hua Zhang, Hui-Xin He, Tao Mu, Zhong Fan Liu. Thin Solid Films,
327-329, (1998), 778-780.
- Charactrisaton
of conductive molecular films on silicon: Auger electron spectroscopy,
X-ray photoelectron spectroscopy, atomic force microscopy and
surface photovoltage. A. Komolov, K. Schaumburg, P.J. Moller,
V. Monachov. Applied Surface Science, 142, (1999), 591-597
- Local
mechanical spectroscopy with nanometer-scale lateral resolution.
F.Oulevey, G.Gremaud, A.Se_moroz, A.J.Kulik, N A.Burnham, E.Dupas,
D.Gourdon. Review of scientific instruments. V. 69. 5 MAY. 1998.P.2085-2094.
- Surface
Forces and Adhesion. N.A. Burnham and A.J. Kulik
- Scanning
local-acceleration microscopy. N. A. Burnham, A. J. Kulik,
G. Gremaud, P.-J. Gallo, and F. Oulevey.
- JVST B - Microelectronics and Nanometer Structures. 1996.
- Electrical
Testing of Gold Nanostructures by Conducting Atomic Force Micriscopy.
Res.Rep. IBM & Cambr.Un.
- How
does a tip tap? N.A.Burnham,O.P.Behrend, F.Oulevey, G.Gremaud,
P-J.Gallo, D.Gourdon, E.Dupas, A.J.Kulik, H.M.Pollock. G.A.D.Briggs.
Nanotechnology. V.8. 1997. P.67-75.
- Development
of contact scanning probe lithography methods forfabrication of
lateral nanodimensional elements.V.F. Dryakhlushin, A.Yu.
Klimov, V.V. Rogov, V.I. Shashkin*, L.V. Sukhodoev, D.G. Volgunov,
and N.V. Vostokov. (Êîíêóðñ NT-MDT/NANOWORLD 1999).
- Growth
of InAs quantum dots and GaAs cap-layers by MOVPEV. I. Shashkin,
V. M. Danil'tsev, Yu. N. Drozdov, O. I. Khrykin, A. V. Murel,
and N. V. Vostokov. (Êîíêóðñ NT-MDT/NANOWORLD 1999).
- Growth
of InAs quantum dots and GaAs cap-layers by MOVPE
- AFM
characterisation of domain structure of ferroelectric TGS crystals
on a nanoscaleA.L.Tolstichina, N.V.Belugina, S.A.Shikin. Ultramicroscopy
1999. (Êîíêóðñ NT-MDT/NANOWORLD 1999).
- MBE-growth
peculiarities of fluoride (CdF2-CaF2) thin film structures.N.S.Sokolov,
S.M.Suturin. (Êîíêóðñ NT-MDT/NANOWORLD 1999).
- Manganese
Fluoride Epitaxial Growth on Si(111)O.V. Anisimov, A.G. Banshchikov,
A.V. Krupin, M.M. Moisseeva, N.S. Sokolov, V.P. Ulin, N.L. Yakovlev.
(Êîíêóðñ NT-MDT/NANOWORLD 1999).
- GROWTH
MODE STUDY OF ULTRATHIN HTSC YBCO FILMS ON YBaCuNbO BUFFER . .
I.Grekhov, L.Delimova, I.Liniichuk, A.Lyublinsky, I.Veselovsky,
A.Titkov, M.Dunaevsky, V.Sakharov . (Êîíêóðñ NT-MDT/NANOWORLD
1999).
-
-
- Digital
data readback for a probe storage device. R. V. Lapshin, Review
of Scientific Instruments, vol. 71, no. 12, pp. 4607-4610, 2000.
- Ultrahigh
density, high-data-rate NEMS-based AFM data storage system.
P.Vettiger, J.Brugger, M.Despont et all. Microelectronic Engineering.
V. 46. (1999). P. 11-17.
-
5x5
2D AFM cantilever arrays a first step towards a Terabit storage
device.M.Lutwyche, C.Andreoli, G.Binnig, J.Brugger,
U.Drechsler, W.Haberle, H.Rohrer, H.Rothuizen,
P.Vettiger, G.Yaralioglu, C.Quate. Sensors and Actuators.
V.73. 1999. P.89-94.
-
-
-
Technology
Roadmap for Nanoelectronics
Technology
for nanoelectronic devices based on ultra-high vacuum scanning tunneling
microscopy on the Si(100) surface. G.Palasantzas, B.Ilge, S.Rogge
et all. Microelectronic Engineering. V. 46. (1999). P. 133-136.
- Metal
deposition near the tip of a scanning tunneling microscope.
J.Divisek, B.Steffen, U.Stiming, W.Schmicker. Journ. of Electroanalytical
Chemistry. V. 440. 1997. P.169-172.
- Current-dependent
growth of silicon nitride lines using a conducting tip AFM R.K.
Workman, C.A. Peterson, D. Sarid .Surface Science. V.423. 1999.L277-L279.
- Scanning
probe lithography for electrode surface modification. H.Sugimura,
O.Takai, N.Nakagiri. Journal of Electroanalytical Chemistry.
V.473.1999.P.230-234.
- Dynamic
oxide interfaces by microscopic techniques at high resolutions.
Y. Iwasawa. Surface Science.V.402-404.1998.P.8-19.
- Field
induced oxidation of silicon by SPM: study of the mechanism
at negative sample voltage by STM, ESTMand AFM. G.Abadal,
F.P'erez-Murano, N.Barniol, X.Aymerich. Appl.Phys.A. V.66. 1998.
S791-S795.
- Electrochemical
nanostructuring. D.M.Kolb, R.Uiimann, J.C.Ziegler. Electrochimica
Acta. V. 43. Nos. 19-20. 1998. P. 2751-2760.
- Nanolithography
by local anodic oxidation om metal films using an atomic force
microscope. R.Held, T.Neinzel, PStuderus, K.Ensslin.Physica
E. V.2. 1998. P.748-752.
- NASA applications
of molecular nanotechnology. A.Globus, D.Bailey, J.Han,
R.Jaffe, C.Levit, R.Merkle, D.Srivastava.Journal of the British
Interplanetary Society. V.51. 1998. P.145-152.
- Nanometer
scale lithography on silicon, titanium and PMMA resist using
scanning probe microscopy. E.Dubois, J.-L.Bubbendor. Solid-State
Electronics. V. 43. 1999. P.1085-1089.
-
Sections
|
|
