SPM-glossary

Founding Fathers of Scanning Probe (Proximity) Microscopy


Russel Young (left) and his co-workers Fredric Scire and John Ward with the Topografiner, precursor of SPM.
 

Heinrich Rohrer, left, and Gerd K. Binnig with their STM.
Preliminary remarks.
     Main attention in this Glossary is focused on SPM terms related to microscopy techniques where the probe is brought to nearest proximity to sample surface, so-called Scanning Proximity Microscopy (SXM) techniques.
We do not include in this Glossary terms related to microscopies with usage particle, ray, beam probes like the Scanning Electron Microscopy, Ion Microscopy and so on.